Measurement of chromatic dispersion of microstructured polymer fibers by white-light spectral interferometry

Petr Hlubina, Dalibor Ciprian, Michael Henoch Frosz, Kristian Nielsen

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearch

Abstract

We present a white-light spectral interferometric method for measuring the chromatic dispersion of microstructured fibers made of polymethyl methacrylate (PMMA). The method uses an unbalanced Mach-Zehnder interferometer with the fiber of known length placed in one of the interferometer arms and the other arm with adjustable path length. We record the spectral interferograms to measure the equalization wavelength as a function of the path length difference, or equivalently the differential group refractive index dispersion over a wide wavelength range. First, we verify the applicability of the method by measuring the wavelength dependence of the differential group refractive index of a pure silica fiber. We apply a five-term power series fit to the measured data and confirm by its differentiation that the chromatic dispersion of pure silica glass agrees well with theory. Second, we measure the chromatic dispersion for the fundamental mode supported by two different PMMA microstructured fibers, the multimode fiber and the large-mode area one.
Original languageEnglish
Title of host publicationOptical Measurement Systems for Industrial Inspection : Proceedings of SPIE
Volume7389
PublisherSPIE - International Society for Optical Engineering
Publication date2009
Publication statusPublished - 2009
EventSPIE Europe Optical Metrology 2009 - Munich, Germany
Duration: 1 Jan 2009 → …

Conference

ConferenceSPIE Europe Optical Metrology 2009
CityMunich, Germany
Period01/01/2009 → …

Cite this

Hlubina, P., Ciprian, D., Frosz, M. H., & Nielsen, K. (2009). Measurement of chromatic dispersion of microstructured polymer fibers by white-light spectral interferometry. In Optical Measurement Systems for Industrial Inspection: Proceedings of SPIE (Vol. 7389). SPIE - International Society for Optical Engineering.