Abstract
We present a white-light spectral interferometric method for measuring the chromatic dispersion of microstructured
fibers made of polymethyl methacrylate (PMMA). The method uses an unbalanced Mach-Zehnder interferometer with the fiber of known length placed in one of the interferometer arms and the other arm with adjustable path length. We record the spectral interferograms to measure the equalization wavelength as a function of the path length difference, or equivalently the differential group refractive index dispersion over a wide wavelength range. First, we verify the applicability of the method by measuring the wavelength dependence of the differential
group refractive index of a pure silica fiber. We apply a five-term power series fit to the measured data and confirm by its differentiation that the chromatic dispersion of pure silica glass agrees well with theory. Second, we measure the chromatic dispersion for the fundamental mode supported by two different PMMA microstructured fibers, the multimode fiber and the large-mode area one.
Original language | English |
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Title of host publication | Optical Measurement Systems for Industrial Inspection : Proceedings of SPIE |
Volume | 7389 |
Publisher | SPIE - International Society for Optical Engineering |
Publication date | 2009 |
Publication status | Published - 2009 |
Event | SPIE Europe Optical Metrology 2009 - Munich, Germany Duration: 14 Jun 2009 → 18 Jun 2009 |
Conference
Conference | SPIE Europe Optical Metrology 2009 |
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Country/Territory | Germany |
City | Munich |
Period | 14/06/2009 → 18/06/2009 |