Measurement of charge density in nanoscale materials using off-axis electron holography

Fengshan Zheng*, Jan Caron, Vadim Migunov, Marco Beleggia, Giulio Pozzi, Rafal E. Dunin-Borkowski

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

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Abstract

Three approaches for the measurement of charge density distributions in nanoscale materials from electron optical phase images recorded using off-axis electron holography are illustrated through the study of an electrically biased needle-shaped sample. We highlight the advantages of using a model-based iterative algorithm, which allows a priori information, such as the shape of the object and the influence of charges that are located outside the field of view, to be taken into account. The recovered charge density can be used to infer the electric field and electrostatic potential.

Original languageEnglish
Article number146881
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume241
Number of pages18
ISSN0368-2048
DOIs
Publication statusPublished - 2020

Keywords

  • Charge density
  • Electric field
  • Electrostatic potential
  • Model-based iterative reconstruction
  • Off-axis electron holography
  • Transmission electron microscopy

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