Measurement of charge density in nanoscale materials using off-axis electron holography

Fengshan Zheng; Jan Caron; Vadim Migunov; Marco Beleggia; Giulio Pozzi; Rafal E. Dunin-Borkowski

doi:10.1016/j.elspec.2019.07.002

Measurement of charge density in nanoscale materials using off-axis electron holography

Fengshan Zheng^*, Jan Caron, Vadim Migunov, Marco Beleggia, Giulio Pozzi, Rafal E. Dunin-Borkowski

^*Corresponding author for this work

Jülich Research Centre

Research output: Contribution to journal › Journal article › Research › peer-review

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Abstract

Three approaches for the measurement of charge density distributions in nanoscale materials from electron optical phase images recorded using off-axis electron holography are illustrated through the study of an electrically biased needle-shaped sample. We highlight the advantages of using a model-based iterative algorithm, which allows a priori information, such as the shape of the object and the influence of charges that are located outside the field of view, to be taken into account. The recovered charge density can be used to infer the electric field and electrostatic potential.

Original language	English
Article number	146881
Journal	Journal of Electron Spectroscopy and Related Phenomena
Volume	241
Number of pages	18
ISSN	0368-2048
DOIs	https://doi.org/10.1016/j.elspec.2019.07.002
Publication status	Published - 2020

Keywords

Charge density
Electric field
Electrostatic potential
Model-based iterative reconstruction
Off-axis electron holography
Transmission electron microscopy

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10.1016/j.elspec.2019.07.002

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title = "Measurement of charge density in nanoscale materials using off-axis electron holography",

abstract = "Three approaches for the measurement of charge density distributions in nanoscale materials from electron optical phase images recorded using off-axis electron holography are illustrated through the study of an electrically biased needle-shaped sample. We highlight the advantages of using a model-based iterative algorithm, which allows a priori information, such as the shape of the object and the influence of charges that are located outside the field of view, to be taken into account. The recovered charge density can be used to infer the electric field and electrostatic potential.",

keywords = "Charge density, Electric field, Electrostatic potential, Model-based iterative reconstruction, Off-axis electron holography, Transmission electron microscopy",

author = "Fengshan Zheng and Jan Caron and Vadim Migunov and Marco Beleggia and Giulio Pozzi and Dunin-Borkowski, {Rafal E.}",

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TY - JOUR

T1 - Measurement of charge density in nanoscale materials using off-axis electron holography

AU - Zheng, Fengshan

AU - Caron, Jan

AU - Migunov, Vadim

AU - Beleggia, Marco

AU - Pozzi, Giulio

AU - Dunin-Borkowski, Rafal E.

PY - 2020

Y1 - 2020

N2 - Three approaches for the measurement of charge density distributions in nanoscale materials from electron optical phase images recorded using off-axis electron holography are illustrated through the study of an electrically biased needle-shaped sample. We highlight the advantages of using a model-based iterative algorithm, which allows a priori information, such as the shape of the object and the influence of charges that are located outside the field of view, to be taken into account. The recovered charge density can be used to infer the electric field and electrostatic potential.

AB - Three approaches for the measurement of charge density distributions in nanoscale materials from electron optical phase images recorded using off-axis electron holography are illustrated through the study of an electrically biased needle-shaped sample. We highlight the advantages of using a model-based iterative algorithm, which allows a priori information, such as the shape of the object and the influence of charges that are located outside the field of view, to be taken into account. The recovered charge density can be used to infer the electric field and electrostatic potential.

KW - Charge density

KW - Electric field

KW - Electrostatic potential

KW - Model-based iterative reconstruction

KW - Off-axis electron holography

KW - Transmission electron microscopy

U2 - 10.1016/j.elspec.2019.07.002

DO - 10.1016/j.elspec.2019.07.002

M3 - Journal article

AN - SCOPUS:85069851645

SN - 0368-2048

VL - 241

JO - Journal of Electron Spectroscopy and Related Phenomena

JF - Journal of Electron Spectroscopy and Related Phenomena

M1 - 146881

ER -

Measurement of charge density in nanoscale materials using off-axis electron holography

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Keywords

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