Measurement of Charge at Grain-Boundary Edge Dislocations in Ca-doped and Undoped YBCO by Electron Holography

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Original language	English
Journal	Microscopy and Microanalysis
Volume	9
Issue number	Supplement S02
Pages (from-to)	784-785
Number of pages	2
ISSN	1431-9276
DOIs	https://doi.org/10.1017/S1431927603443924
Publication status	Published - 2003
Externally published	Yes
Event	Microscopy and Microanalysis 2003 - San Antonia, TX, United States Duration: 3 Aug 2003 → 7 Aug 2003

Conference	Microscopy and Microanalysis 2003
Country/Territory	United States
City	San Antonia, TX
Period	03/08/2003 → 07/08/2003

Access to Document

@inproceedings{cc937246cc5645338acc5f28338bde50,

title = "Measurement of Charge at Grain-Boundary Edge Dislocations in Ca-doped and Undoped YBCO by Electron Holography",

author = "Schofield, \{M. A.\} and Marco Beleggia and Y. Zhu and K. Guth and Ch. Jooss",

year = "2003",

doi = "10.1017/S1431927603443924",

language = "English",

volume = "9",

pages = "784--785",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "Supplement S02",

note = "Microscopy and Microanalysis 2003 ; Conference date: 03-08-2003 Through 07-08-2003",

}

TY - GEN

T1 - Measurement of Charge at Grain-Boundary Edge Dislocations in Ca-doped and Undoped YBCO by Electron Holography

AU - Schofield, M. A.

AU - Beleggia, Marco

AU - Zhu, Y.

AU - Guth, K.

AU - Jooss, Ch.

PY - 2003

Y1 - 2003

U2 - 10.1017/S1431927603443924

DO - 10.1017/S1431927603443924

M3 - Conference article

SN - 1431-9276

VL - 9

SP - 784

EP - 785

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - Supplement S02

T2 - Microscopy and Microanalysis 2003

Y2 - 3 August 2003 through 7 August 2003

ER -