Measured reflectance of graded multilayer mirrors designed for astronomical hard X-ray telescopes

Finn Erland Christensen, W.W. Craig, D.L. Windt, M.A. Jimenez-Garate, C.J. Hailey, F.A. Harrison, P.H. Mao, J.M. Chakan, E. Ziegler, V. Honkimaki

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

Future astronomical X-ray telescopes, including the balloon-borne High-Energy Focusing Telescope (HEFT) and the Constellation-X Hard X-ray Telescope (Con-X HXT) plan to incorporate depth-graded multilayer coatings in order to extend sensitivity into the hard X-ray (10 less than or similar to E less than or similar to 80 keV) band. In this paper, we present measurements of the reflectance in the 18-170 keV energy range of a cylindrical prototype nested optic taken at the European Synchrotron Radiation Facility (ESRF). The mirror segments, mounted in a single bounce stack, are coated with depth-graded W/Si multilayers optimized for broadband performance up to 69.5 keV (WK-edge). These designs are ideal for both the HEFT and Con-X HXT applications. We compare the measurements to model calculations to demonstrate that the reflectivity can be well described by the intended power law distribution of the bilayer thicknesses, and that the coatings are uniform at the 5% level over the mirror surface. Finally, we apply the measurements to predict effective areas achievable for HEFT and Con-X HXT using these W/Si designs.
Original languageEnglish
JournalNuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment
Volume451
Issue number3
Pages (from-to)572-581
ISSN0168-9002
Publication statusPublished - 2000

Keywords

  • synchrotron radiation
  • hard X-ray telescopes
  • multilayers

Fingerprint Dive into the research topics of 'Measured reflectance of graded multilayer mirrors designed for astronomical hard X-ray telescopes'. Together they form a unique fingerprint.

Cite this