McXtrace: A modern ray-tracing package for X-ray instrumentation

Erik Bergbäck Knudsen; A. Prodi; Peter Kjær Willendrup; Kim Lefmann; J. Baltser; C. Gundlach; M. S. Del Rio; C. Ferrero; Robert Feidenhans'l

doi:10.1117/12.894179

McXtrace: A modern ray-tracing package for X-ray instrumentation

Erik Bergbäck Knudsen, A. Prodi, Peter Kjær Willendrup, Kim Lefmann, J. Baltser, C. Gundlach, M. S. Del Rio, C. Ferrero, Robert Feidenhans'l

Research output: Contribution to journal › Conference article › Research › peer-review

Abstract

we present the developments of the McXtrace project, a free, open source software package based on Monte Carlo ray tracing for simulations and optimisation of complete X-ray instruments. The methodology of building a simulation is presented through an example beamline, namely Beamline 811 at MAX-lab, Lund, Sweden - a beamline dedicated to materials science. © 2011 COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

Original language	English
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	8141
Issue number	1
Pages (from-to)	81410G
ISSN	0277-786X
DOIs	https://doi.org/10.1117/12.894179
Publication status	Published - 2011
Event	Advances in Computational Methods for X-Ray Optics II - San Diego, CA, United States Duration: 21 Aug 2011 → 25 Aug 2011

Conference

Conference	Advances in Computational Methods for X-Ray Optics II
Country/Territory	United States
City	San Diego, CA
Period	21/08/2011 → 25/08/2011

Keywords

Optics
Materials characterization and modelling
Physics
Engineering
X-ray simulations
ray tracing
McXtrace
Monte Carlo

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10.1117/12.894179

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title = "McXtrace: A modern ray-tracing package for X-ray instrumentation",

abstract = "we present the developments of the McXtrace project, a free, open source software package based on Monte Carlo ray tracing for simulations and optimisation of complete X-ray instruments. The methodology of building a simulation is presented through an example beamline, namely Beamline 811 at MAX-lab, Lund, Sweden - a beamline dedicated to materials science. {\textcopyright} 2011 COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.",

keywords = "Optics, Materials characterization and modelling, Physics, Engineering, X-ray simulations, ray tracing, McXtrace, Monte Carlo, Materialekarakterisering og modellering",

author = "{Bergb{\"a}ck Knudsen}, Erik and A. Prodi and Willendrup, {Peter Kj{\ae}r} and Kim Lefmann and J. Baltser and C. Gundlach and {Del Rio}, {M. S.} and C. Ferrero and Robert Feidenhans'l",

year = "2011",

doi = "10.1117/12.894179",

language = "English",

volume = "8141",

pages = "81410G",

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AU - Bergbäck Knudsen, Erik

AU - Prodi, A.

AU - Willendrup, Peter Kjær

AU - Lefmann, Kim

AU - Baltser, J.

AU - Gundlach, C.

AU - Del Rio, M. S.

AU - Ferrero, C.

AU - Feidenhans'l, Robert

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KW - Optics

KW - Materials characterization and modelling

KW - Physics

KW - Engineering

KW - X-ray simulations

KW - ray tracing

KW - McXtrace

KW - Monte Carlo

KW - Materialekarakterisering og modellering

U2 - 10.1117/12.894179

DO - 10.1117/12.894179

M3 - Conference article

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JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

IS - 1

T2 - Advances in Computational Methods for X-Ray Optics II

Y2 - 21 August 2011 through 25 August 2011

ER -

McXtrace: A modern ray-tracing package for X-ray instrumentation

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