McXtrace: A modern ray-tracing package for X-ray instrumentation

Erik Bergbäck Knudsen, A. Prodi, Peter Kjær Willendrup, Kim Lefmann, J. Baltser, C. Gundlach, M. S. Del Rio, C. Ferrero, Robert Feidenhans'l

    Research output: Contribution to journalConference articleResearchpeer-review

    Abstract

    we present the developments of the McXtrace project, a free, open source software package based on Monte Carlo ray tracing for simulations and optimisation of complete X-ray instruments. The methodology of building a simulation is presented through an example beamline, namely Beamline 811 at MAX-lab, Lund, Sweden - a beamline dedicated to materials science. © 2011 COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
    Original languageEnglish
    JournalProceedings of SPIE--the international society for optical engineering
    Volume8141
    Issue number1
    Pages (from-to)81410G
    ISSN0277-786X
    DOIs
    Publication statusPublished - 2011
    EventAdvances in Computational Methods for X-Ray Optics II - San Diego, CA, United States
    Duration: 21 Aug 201125 Aug 2011

    Conference

    ConferenceAdvances in Computational Methods for X-Ray Optics II
    CountryUnited States
    CitySan Diego, CA
    Period21/08/201125/08/2011

    Keywords

    • Optics
    • Materials characterization and modelling
    • Physics
    • Engineering
    • X-ray simulations
    • ray tracing
    • McXtrace
    • Monte Carlo

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