Magnetic properties of thin Ni films measured by a dc SQUID-based magnetic microscope

O.V. Snigirev; K.E. Andreev; A.M. Tishin; S.A. Gudoshnikov; Jakob Bohr

doi:10.1103/PhysRevB.55.14429

Magnetic properties of thin Ni films measured by a dc SQUID-based magnetic microscope

O.V. Snigirev, K.E. Andreev, A.M. Tishin, S.A. Gudoshnikov, Jakob Bohr

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Abstract

We have applied a scanning HTS (high-temperature superconductor) de SQUID (superconducting quantum interference device) -based magnetic microscope to study the magnetic properties of Au/Ni/Si(100) films in the thickness range from 8 to 200 Angstrom at T = 77 K. A one-domain structure with in-plane orientation of the magnetic moment was found for film thicknesses exceeding 26 Angstrom. A drastic decrease of the magnetization of the film was detected when the thickness is less than 26 Angstrom.

Original language	English
Journal	Physical Review B
Volume	55
Issue number	21
Pages (from-to)	14429-14433
ISSN	2469-9950
DOIs	https://doi.org/10.1103/PhysRevB.55.14429
Publication status	Published - 1997

Bibliographical note

Copyright (1997) by the American Physical Society.

Keywords

BCC
INPLANE
SURFACE
MULTILAYERS
ULTRATHIN FILMS
BEHAVIOR
CO
MONOLAYERS
CROSSOVER
ANISOTROPY

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title = "Magnetic properties of thin Ni films measured by a dc SQUID-based magnetic microscope",

abstract = "We have applied a scanning HTS (high-temperature superconductor) de SQUID (superconducting quantum interference device) -based magnetic microscope to study the magnetic properties of Au/Ni/Si(100) films in the thickness range from 8 to 200 Angstrom at T = 77 K. A one-domain structure with in-plane orientation of the magnetic moment was found for film thicknesses exceeding 26 Angstrom. A drastic decrease of the magnetization of the film was detected when the thickness is less than 26 Angstrom.",

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author = "O.V. Snigirev and K.E. Andreev and A.M. Tishin and S.A. Gudoshnikov and Jakob Bohr",

note = "Copyright (1997) by the American Physical Society.",

year = "1997",

doi = "10.1103/PhysRevB.55.14429",

language = "English",

volume = "55",

pages = "14429--14433",

journal = "Physical Review B (Condensed Matter and Materials Physics)",

issn = "1098-0121",

publisher = "American Physical Society",

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T1 - Magnetic properties of thin Ni films measured by a dc SQUID-based magnetic microscope

AU - Snigirev, O.V.

AU - Andreev, K.E.

AU - Tishin, A.M.

AU - Gudoshnikov, S.A.

AU - Bohr, Jakob

N1 - Copyright (1997) by the American Physical Society.

PY - 1997

Y1 - 1997

N2 - We have applied a scanning HTS (high-temperature superconductor) de SQUID (superconducting quantum interference device) -based magnetic microscope to study the magnetic properties of Au/Ni/Si(100) films in the thickness range from 8 to 200 Angstrom at T = 77 K. A one-domain structure with in-plane orientation of the magnetic moment was found for film thicknesses exceeding 26 Angstrom. A drastic decrease of the magnetization of the film was detected when the thickness is less than 26 Angstrom.

AB - We have applied a scanning HTS (high-temperature superconductor) de SQUID (superconducting quantum interference device) -based magnetic microscope to study the magnetic properties of Au/Ni/Si(100) films in the thickness range from 8 to 200 Angstrom at T = 77 K. A one-domain structure with in-plane orientation of the magnetic moment was found for film thicknesses exceeding 26 Angstrom. A drastic decrease of the magnetization of the film was detected when the thickness is less than 26 Angstrom.

KW - BCC

KW - INPLANE

KW - SURFACE

KW - MULTILAYERS

KW - ULTRATHIN FILMS

KW - BEHAVIOR

KW - CO

KW - MONOLAYERS

KW - CROSSOVER

KW - ANISOTROPY

U2 - 10.1103/PhysRevB.55.14429

DO - 10.1103/PhysRevB.55.14429

M3 - Journal article

VL - 55

SP - 14429

EP - 14433

JO - Physical Review B (Condensed Matter and Materials Physics)

JF - Physical Review B (Condensed Matter and Materials Physics)

SN - 1098-0121

IS - 21

ER -

Magnetic properties of thin Ni films measured by a dc SQUID-based magnetic microscope

Abstract

Bibliographical note

Keywords

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