Magnetic properties of thin Ni films measured by a dc SQUID-based magnetic microscope

O.V. Snigirev, K.E. Andreev, A.M. Tishin, S.A. Gudoshnikov, Jakob Bohr

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Abstract

We have applied a scanning HTS (high-temperature superconductor) de SQUID (superconducting quantum interference device) -based magnetic microscope to study the magnetic properties of Au/Ni/Si(100) films in the thickness range from 8 to 200 Angstrom at T = 77 K. A one-domain structure with in-plane orientation of the magnetic moment was found for film thicknesses exceeding 26 Angstrom. A drastic decrease of the magnetization of the film was detected when the thickness is less than 26 Angstrom.
Original languageEnglish
JournalPhysical Review B
Volume55
Issue number21
Pages (from-to)14429-14433
ISSN2469-9950
DOIs
Publication statusPublished - 1997

Bibliographical note

Copyright (1997) by the American Physical Society.

Keywords

  • BCC
  • INPLANE
  • SURFACE
  • MULTILAYERS
  • ULTRATHIN FILMS
  • BEHAVIOR
  • CO
  • MONOLAYERS
  • CROSSOVER
  • ANISOTROPY

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