Magnetic Characterization of Isolated CoFeB/Cu Nanowires by Off-Axis Electron Holography

Azadeh Akhtari-Zavareh; L. P. Carignan; A. Yelon; D. Menard; Takeshi Kasama; R. Herring; Rafal E. Dunin-Borkowski; M R McCartney; K. L. Kavanagh

doi:10.1017/S1431927614003122

Magnetic Characterization of Isolated CoFeB/Cu Nanowires by Off-Axis Electron Holography

Azadeh Akhtari-Zavareh, L. P. Carignan, A. Yelon, D. Menard, Takeshi Kasama, R. Herring, Rafal E. Dunin-Borkowski, M R McCartney, K. L. Kavanagh

Research output: Contribution to journal › Conference abstract in journal › Research › peer-review

Original language	English
Journal	Microscopy and Microanalysis
Volume	20
Issue number	S3
Pages (from-to)	280-281
Number of pages	2
ISSN	1431-9276
DOIs	https://doi.org/10.1017/S1431927614003122
Publication status	Published - 2014
Event	Microscopy and Microanalysis 2014 - Connecticut Convention Center, Hartford, CT, United States Duration: 3 Aug 2014 → 7 Aug 2014 http://microscopy.org/MandM/2014/

Conference

Conference	Microscopy and Microanalysis 2014
Location	Connecticut Convention Center
Country/Territory	United States
City	Hartford, CT
Period	03/08/2014 → 07/08/2014
Internet address	http://microscopy.org/MandM/2014/

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10.1017/S1431927614003122

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title = "Magnetic Characterization of Isolated CoFeB/Cu Nanowires by Off-Axis Electron Holography",

author = "Azadeh Akhtari-Zavareh and Carignan, \{L. P.\} and A. Yelon and D. Menard and Takeshi Kasama and R. Herring and Dunin-Borkowski, \{Rafal E.\} and McCartney, \{M R\} and Kavanagh, \{K. L.\}",

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T1 - Magnetic Characterization of Isolated CoFeB/Cu Nanowires by Off-Axis Electron Holography

AU - Akhtari-Zavareh, Azadeh

AU - Carignan, L. P.

AU - Yelon, A.

AU - Menard, D.

AU - Kasama, Takeshi

AU - Herring, R.

AU - Dunin-Borkowski, Rafal E.

AU - McCartney, M R

AU - Kavanagh, K. L.

PY - 2014

Y1 - 2014

U2 - 10.1017/S1431927614003122

DO - 10.1017/S1431927614003122

M3 - Conference abstract in journal

SN - 1431-9276

VL - 20

SP - 280

EP - 281

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S3

T2 - Microscopy and Microanalysis 2014

Y2 - 3 August 2014 through 7 August 2014

ER -