Low vacuum and environmental scanning electron microscopy. Basic principles

Jørgen Bilde-Sørensen

    Research output: Contribution to conferenceConference abstract for conferenceResearch

    Original languageEnglish
    Publication date1998
    Publication statusPublished - 1998
    Event3-day Course in Low Vacuum and Environmental Scanning Electron Microscopy - Göteborg, Sweden
    Duration: 17 Nov 199819 Nov 1998

    Conference

    Conference3-day Course in Low Vacuum and Environmental Scanning Electron Microscopy
    CountrySweden
    CityGöteborg
    Period17/11/199819/11/1998

    Cite this

    Bilde-Sørensen, J. (1998). Low vacuum and environmental scanning electron microscopy. Basic principles. Abstract from 3-day Course in Low Vacuum and Environmental Scanning Electron Microscopy, Göteborg, Sweden.
    Bilde-Sørensen, Jørgen. / Low vacuum and environmental scanning electron microscopy. Basic principles. Abstract from 3-day Course in Low Vacuum and Environmental Scanning Electron Microscopy, Göteborg, Sweden.
    @conference{31fc1a5f1f954054a2e741ca8bf6b5ea,
    title = "Low vacuum and environmental scanning electron microscopy. Basic principles",
    keywords = "Industrielle materialer",
    author = "J{\o}rgen Bilde-S{\o}rensen",
    year = "1998",
    language = "English",
    note = "3-day Course in Low Vacuum and Environmental Scanning Electron Microscopy, LV-ESEM 98 ; Conference date: 17-11-1998 Through 19-11-1998",

    }

    Bilde-Sørensen, J 1998, 'Low vacuum and environmental scanning electron microscopy. Basic principles' 3-day Course in Low Vacuum and Environmental Scanning Electron Microscopy, Göteborg, Sweden, 17/11/1998 - 19/11/1998, .

    Low vacuum and environmental scanning electron microscopy. Basic principles. / Bilde-Sørensen, Jørgen.

    1998. Abstract from 3-day Course in Low Vacuum and Environmental Scanning Electron Microscopy, Göteborg, Sweden.

    Research output: Contribution to conferenceConference abstract for conferenceResearch

    TY - ABST

    T1 - Low vacuum and environmental scanning electron microscopy. Basic principles

    AU - Bilde-Sørensen, Jørgen

    PY - 1998

    Y1 - 1998

    KW - Industrielle materialer

    M3 - Conference abstract for conference

    ER -

    Bilde-Sørensen J. Low vacuum and environmental scanning electron microscopy. Basic principles. 1998. Abstract from 3-day Course in Low Vacuum and Environmental Scanning Electron Microscopy, Göteborg, Sweden.