Low frequency noise in resonant Josephson soliton oscillators

Jørn Bindslev Hansen; T. Holst; Frederick C. Wellstood; John Clarke

doi:10.1109/20.133928

Low frequency noise in resonant Josephson soliton oscillators

Jørn Bindslev Hansen, T. Holst, Frederick C. Wellstood, John Clarke

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Abstract

The noise in the resonant soliton mode of long and narrow Josephson tunnel junctions (Josephson transmission lines or JTLs) have been measured in the frequency range from 0.1 Hz to 25 kHz by means of a DC SQUID. The measured white noise was found, to within a factor of two, to be equal to the Nyquist voltage noise in a resistance equal to the dynamic resistance RD of the current-voltage characteristic of the bias point. In contrast, measurements of the linewidth of the microwave radiation from the same JTL showed that the spectral density of the underlying noise voltage scaled as R D2/RS where RS is the static resistance. The origin of the different behavior is not known

Original language	English
Journal	I E E E Transactions on Magnetics
Volume	27
Issue number	2, 4
Pages (from-to)	3343-3346
ISSN	0018-9464
DOIs	https://doi.org/10.1109/20.133928
Publication status	Published - 1991

Bibliographical note

Copyright: 1991 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

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title = "Low frequency noise in resonant Josephson soliton oscillators",

abstract = "The noise in the resonant soliton mode of long and narrow Josephson tunnel junctions (Josephson transmission lines or JTLs) have been measured in the frequency range from 0.1 Hz to 25 kHz by means of a DC SQUID. The measured white noise was found, to within a factor of two, to be equal to the Nyquist voltage noise in a resistance equal to the dynamic resistance RD of the current-voltage characteristic of the bias point. In contrast, measurements of the linewidth of the microwave radiation from the same JTL showed that the spectral density of the underlying noise voltage scaled as R D2/RS where RS is the static resistance. The origin of the different behavior is not known",

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note = "Copyright: 1991 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE",

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doi = "10.1109/20.133928",

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T1 - Low frequency noise in resonant Josephson soliton oscillators

AU - Hansen, Jørn Bindslev

AU - Holst, T.

AU - Wellstood, Frederick C.

AU - Clarke, John

N1 - Copyright: 1991 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

PY - 1991

Y1 - 1991

N2 - The noise in the resonant soliton mode of long and narrow Josephson tunnel junctions (Josephson transmission lines or JTLs) have been measured in the frequency range from 0.1 Hz to 25 kHz by means of a DC SQUID. The measured white noise was found, to within a factor of two, to be equal to the Nyquist voltage noise in a resistance equal to the dynamic resistance RD of the current-voltage characteristic of the bias point. In contrast, measurements of the linewidth of the microwave radiation from the same JTL showed that the spectral density of the underlying noise voltage scaled as R D2/RS where RS is the static resistance. The origin of the different behavior is not known

AB - The noise in the resonant soliton mode of long and narrow Josephson tunnel junctions (Josephson transmission lines or JTLs) have been measured in the frequency range from 0.1 Hz to 25 kHz by means of a DC SQUID. The measured white noise was found, to within a factor of two, to be equal to the Nyquist voltage noise in a resistance equal to the dynamic resistance RD of the current-voltage characteristic of the bias point. In contrast, measurements of the linewidth of the microwave radiation from the same JTL showed that the spectral density of the underlying noise voltage scaled as R D2/RS where RS is the static resistance. The origin of the different behavior is not known

U2 - 10.1109/20.133928

DO - 10.1109/20.133928

M3 - Journal article

VL - 27

SP - 3343

EP - 3346

JO - I E E E Transactions on Magnetics

JF - I E E E Transactions on Magnetics

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