Local residual stress in partially recrystallized iron characterized using high resolution electron backscatter diffraction

T. Wang; D. Juul Jensen; A. Godfrey; Y. Zhang

doi:10.1088/1757-899x/580/1/012049

Local residual stress in partially recrystallized iron characterized using high resolution electron backscatter diffraction

T. Wang
, D. Juul Jensen
, A. Godfrey
, Y. Zhang^*

^*Corresponding author for this work

Tsinghua University

Research output: Contribution to journal › Conference article › Research › peer-review

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Abstract

Recent synchrotron measurements have shown the presence of local residual stress within nearly defect-free grains in partially recrystallized samples. A detailed quantification of such local stress is very important for understanding local boundary migration during recrystallization and for tailoring the microstructure of materials. In this study, we utilize high resolution electron backscatter diffraction (HR-EBSD, Wilkinson’s method) to investigate the local residual stress in recrystallized grains in a sample of partially recrystallized iron. The effects of reference selection on the strain distribution are also discussed.

Original language	English
Article number	012049
Journal	I O P Conference Series: Materials Science and Engineering
Volume	580
Issue number	1
Number of pages	6
ISSN	1757-8981
DOIs	https://doi.org/10.1088/1757-899x/580/1/012049
Publication status	Published - 2019
Event	40th Risø International Symposium on Material Science: Metal Microstructures in 2D, 3D, and 4D - Roskilde, Denmark Duration: 2 Sept 2019 → 6 Sept 2019

Conference

Conference	40th Risø International Symposium on Material Science: Metal Microstructures in 2D, 3D, and 4D
Country/Territory	Denmark
City	Roskilde
Period	02/09/2019 → 06/09/2019

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@inproceedings{c656fd4f177a4eeaa3481917db5a2354,

title = "Local residual stress in partially recrystallized iron characterized using high resolution electron backscatter diffraction",

abstract = "Recent synchrotron measurements have shown the presence of local residual stress within nearly defect-free grains in partially recrystallized samples. A detailed quantification of such local stress is very important for understanding local boundary migration during recrystallization and for tailoring the microstructure of materials. In this study, we utilize high resolution electron backscatter diffraction (HR-EBSD, Wilkinson{\textquoteright}s method) to investigate the local residual stress in recrystallized grains in a sample of partially recrystallized iron. The effects of reference selection on the strain distribution are also discussed.",

author = "T. Wang and \{Juul Jensen\}, D. and A. Godfrey and Y. Zhang",

year = "2019",

doi = "10.1088/1757-899x/580/1/012049",

language = "English",

volume = "580",

journal = "I O P Conference Series: Materials Science and Engineering",

issn = "1757-8981",

publisher = "IOP Publishing",

number = "1",

note = "40th Ris{\o} International Symposium on Material Science: Metal Microstructures in 2D, 3D, and 4D ; Conference date: 02-09-2019 Through 06-09-2019",

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TY - GEN

T1 - Local residual stress in partially recrystallized iron characterized using high resolution electron backscatter diffraction

AU - Wang, T.

AU - Juul Jensen, D.

AU - Godfrey, A.

AU - Zhang, Y.

PY - 2019

Y1 - 2019

N2 - Recent synchrotron measurements have shown the presence of local residual stress within nearly defect-free grains in partially recrystallized samples. A detailed quantification of such local stress is very important for understanding local boundary migration during recrystallization and for tailoring the microstructure of materials. In this study, we utilize high resolution electron backscatter diffraction (HR-EBSD, Wilkinson’s method) to investigate the local residual stress in recrystallized grains in a sample of partially recrystallized iron. The effects of reference selection on the strain distribution are also discussed.

AB - Recent synchrotron measurements have shown the presence of local residual stress within nearly defect-free grains in partially recrystallized samples. A detailed quantification of such local stress is very important for understanding local boundary migration during recrystallization and for tailoring the microstructure of materials. In this study, we utilize high resolution electron backscatter diffraction (HR-EBSD, Wilkinson’s method) to investigate the local residual stress in recrystallized grains in a sample of partially recrystallized iron. The effects of reference selection on the strain distribution are also discussed.

U2 - 10.1088/1757-899x/580/1/012049

DO - 10.1088/1757-899x/580/1/012049

M3 - Conference article

SN - 1757-8981

VL - 580

JO - I O P Conference Series: Materials Science and Engineering

JF - I O P Conference Series: Materials Science and Engineering

IS - 1

M1 - 012049

T2 - 40th Risø International Symposium on Material Science: Metal Microstructures in 2D, 3D, and 4D

Y2 - 2 September 2019 through 6 September 2019

ER -

Local residual stress in partially recrystallized iron characterized using high resolution electron backscatter diffraction

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