Local residual stress in partially recrystallized iron characterized using high resolution electron backscatter diffraction

T. Wang, D. Juul Jensen, A. Godfrey, Y. Zhang*

*Corresponding author for this work

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Abstract

Recent synchrotron measurements have shown the presence of local residual stress within nearly defect-free grains in partially recrystallized samples. A detailed quantification of such local stress is very important for understanding local boundary migration during recrystallization and for tailoring the microstructure of materials. In this study, we utilize high resolution electron backscatter diffraction (HR-EBSD, Wilkinson’s method) to investigate the local residual stress in recrystallized grains in a sample of partially recrystallized iron. The effects of reference selection on the strain distribution are also discussed.
Original languageEnglish
Article number012049
JournalI O P Conference Series: Materials Science and Engineering
Volume580
Issue number1
Number of pages6
ISSN1757-8981
DOIs
Publication statusPublished - 2019
Event40th Risø International Symposium on Material Science: Metal Microstructures in 2D, 3D, and 4D - Roskilde, Denmark
Duration: 2 Sep 20196 Sep 2019

Conference

Conference40th Risø International Symposium on Material Science: Metal Microstructures in 2D, 3D, and 4D
CountryDenmark
CityRoskilde
Period02/09/201906/09/2019

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