LEXR: A low-energy X-ray reflectometer for characterization of ATHENA mirror coatings

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Abstract

Qualification of coating performance at the low-energy range of the Advanced Telescope for High Energy Astrophysics (ATHENA) is important to ensure that the mirror coatings satisfy the performance criteria required to meet ATHENA's science objectives. We report on the design, implementation, and expected performance of a state-of-the-art Low-Energy X-ray Reflectometer (LEXR) acquired with the purpose of qualifying the soft energy X-ray performance of mirror coatings for ATHENA. The reflectometer components are housed in a vacuum chamber and utilizes a microfocus Al source with custom made Kirkpatrick-Baez mirrors and W/Si monochromator to produce a collimated beam of 1.487 keV photons. The system has been designed with source interchangeability, allowing reconfiguration to an 8.048 keV reflectometer using a Cu source or other energies with sources such as Fe, Mg, etc. Several mirror samples can be mounted on a motorized stage, and a 2D CCD camera is used to obtain spatially resolved detection.
Original languageEnglish
Title of host publicationProceedings of SPIE 11119, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX
EditorsStephen L. O'Dell, Giovanni Pareschi
Number of pages9
Volume11119
PublisherSPIE - International Society for Optical Engineering
Publication date2019
Article number 111191F
DOIs
Publication statusPublished - 2019
Event2019 SPIE Optical Engineering + Applications - San Diego, United States
Duration: 11 Aug 201915 Aug 2019

Conference

Conference2019 SPIE Optical Engineering + Applications
CountryUnited States
CitySan Diego
Period11/08/201915/08/2019
SeriesProceedings of SPIE, the International Society for Optical Engineering
Volume11119
ISSN0277-786X

Keywords

  • LEXR
  • ATHENA
  • X-ray optics
  • X-ray reectometry
  • Thin-film characterization
  • X-ray telescopes
  • Grazing incidence
  • Coatings

Cite this

Henriksen, P. L., Christensen, F. E., Massahi, S., Ferreira, D. D. M., Svendsen, S., Jafari, A., & Shortt, B. (2019). LEXR: A low-energy X-ray reflectometer for characterization of ATHENA mirror coatings. In S. L. O'Dell, & G. Pareschi (Eds.), Proceedings of SPIE 11119, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX (Vol. 11119). [ 111191F] SPIE - International Society for Optical Engineering. Proceedings of SPIE, the International Society for Optical Engineering, Vol.. 11119 https://doi.org/10.1117/12.2528144