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In this report, stray light is described as a source of uncertainty in spectrometers and spectroradiometers, and through simulation of various kinds of stray light we show the effects these have on the derived quantities of the spectral measurements. The simulated stray light is then sought corrected by the method developed by Zong et al. at NIST and the derived quantities are then compared to the original data. This report is the deliverable of milestone M1.3 in project Center for LED Metrology (LEDMET).
|Publisher||DTU - Department of Photonics Engineering|
|Number of pages||19|
|Publication status||Published - 2018|