Lasing Threshold in Nanolasers with Extreme Dielectric Confinement

Marco Saldutti; Yi Yu; Jesper Mørk

doi:10.1109/ICTON59386.2023.10207455

Lasing Threshold in Nanolasers with Extreme Dielectric Confinement

Marco Saldutti
, Yi Yu
, Jesper Mørk

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Abstract

Nanolasers based on emerging dielectric cavities with deep sub-wavelength optical confinement may offer an unprecedented light-matter coupling rate, near-unity spontaneous emission factor, and ultra-low threshold current. However, the extreme dielectric confinement in these nanolasers questions the standard approach to identifying the lasing threshold. Here, we discuss a new threshold definition, valid from the macro to the nanoscale and reflecting the recycling process that photons undergo in nanolasers with extreme dielectric confinement.

Original language	English
Title of host publication	Proceedings of 23^rd International Conference on Transparent Optical Networks
Number of pages	3
Publisher	IEEE
Publication date	2023
Pages	1-3
ISBN (Print)	9798350303032
DOIs	https://doi.org/10.1109/ICTON59386.2023.10207455
Publication status	Published - 2023
Event	23^rd International Conference on Transparent Optical Networks - Bucharest, Romania Duration: 2 Jul 2023 → 6 Jul 2023 Conference number: 23

Conference

Conference	23^rd International Conference on Transparent Optical Networks
Number	23
Country/Territory	Romania
City	Bucharest
Period	02/07/2023 → 06/07/2023

Keywords

Lasing threshold
Nanolasers
Extreme dielectric confinement;

Access to Document

10.1109/ICTON59386.2023.10207455

OpenUrl availability

Check availability in DTU Findit

Cite this

@inproceedings{ccd98e9ce13e4d81ad2fe889323e42ce,

title = "Lasing Threshold in Nanolasers with Extreme Dielectric Confinement",

abstract = "Nanolasers based on emerging dielectric cavities with deep sub-wavelength optical confinement may offer an unprecedented light-matter coupling rate, near-unity spontaneous emission factor, and ultra-low threshold current. However, the extreme dielectric confinement in these nanolasers questions the standard approach to identifying the lasing threshold. Here, we discuss a new threshold definition, valid from the macro to the nanoscale and reflecting the recycling process that photons undergo in nanolasers with extreme dielectric confinement.",

keywords = "Lasing threshold, Nanolasers, Extreme dielectric confinement;",

author = "Marco Saldutti and Yi Yu and Jesper M{\o}rk",

year = "2023",

doi = "10.1109/ICTON59386.2023.10207455",

language = "English",

isbn = "9798350303032",

pages = "1--3",

booktitle = "Proceedings of 23rd International Conference on Transparent Optical Networks",

publisher = "IEEE",

address = "United States",

note = "23<sup>rd</sup> International Conference on Transparent Optical Networks , ICTON 2023 ; Conference date: 02-07-2023 Through 06-07-2023",

}

TY - GEN

T1 - Lasing Threshold in Nanolasers with Extreme Dielectric Confinement

AU - Saldutti, Marco

AU - Yu, Yi

AU - Mørk, Jesper

N1 - Conference code: 23

PY - 2023

Y1 - 2023

N2 - Nanolasers based on emerging dielectric cavities with deep sub-wavelength optical confinement may offer an unprecedented light-matter coupling rate, near-unity spontaneous emission factor, and ultra-low threshold current. However, the extreme dielectric confinement in these nanolasers questions the standard approach to identifying the lasing threshold. Here, we discuss a new threshold definition, valid from the macro to the nanoscale and reflecting the recycling process that photons undergo in nanolasers with extreme dielectric confinement.

AB - Nanolasers based on emerging dielectric cavities with deep sub-wavelength optical confinement may offer an unprecedented light-matter coupling rate, near-unity spontaneous emission factor, and ultra-low threshold current. However, the extreme dielectric confinement in these nanolasers questions the standard approach to identifying the lasing threshold. Here, we discuss a new threshold definition, valid from the macro to the nanoscale and reflecting the recycling process that photons undergo in nanolasers with extreme dielectric confinement.

KW - Lasing threshold

KW - Nanolasers

KW - Extreme dielectric confinement;

U2 - 10.1109/ICTON59386.2023.10207455

DO - 10.1109/ICTON59386.2023.10207455

M3 - Article in proceedings

SN - 9798350303032

SP - 1

EP - 3

BT - Proceedings of 23rd International Conference on Transparent Optical Networks

PB - IEEE

T2 - 23<sup>rd</sup> International Conference on Transparent Optical Networks

Y2 - 2 July 2023 through 6 July 2023

ER -

Lasing Threshold in Nanolasers with Extreme Dielectric Confinement

Abstract

Conference

Keywords

Access to Document

OpenUrl availability

Fingerprint

Cite this