Lasing Threshold in Nanolasers with Extreme Dielectric Confinement

Marco Saldutti, Yi Yu, Jesper Mørk

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

Nanolasers based on emerging dielectric cavities with deep sub-wavelength optical confinement may offer an unprecedented light-matter coupling rate, near-unity spontaneous emission factor, and ultra-low threshold current. However, the extreme dielectric confinement in these nanolasers questions the standard approach to identifying the lasing threshold. Here, we discuss a new threshold definition, valid from the macro to the nanoscale and reflecting the recycling process that photons undergo in nanolasers with extreme dielectric confinement.
Original languageEnglish
Title of host publicationProceedings of 23rd International Conference on Transparent Optical Networks
Number of pages3
PublisherIEEE
Publication date2023
Pages1-3
ISBN (Print)9798350303032
DOIs
Publication statusPublished - 2023
Event23rd International Conference on Transparent Optical Networks - Bucharest, Romania
Duration: 2 Jul 20236 Jul 2023
Conference number: 23

Conference

Conference23rd International Conference on Transparent Optical Networks
Number23
Country/TerritoryRomania
CityBucharest
Period02/07/202306/07/2023

Keywords

  • Lasing threshold
  • Nanolasers
  • Extreme dielectric confinement;

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