Laser terahertz emission nanoscopy

Angela Pizzuto, Pernille Klarskov, Daniel M. Mittleman

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Abstract

    We demonstrate depletion of terahertz emission from semiconductors by applying a DC bias between a substrate and an AFM probe operating in tapping mode. The depletion is strongly dependent on the probe tapping amplitude.

    Original languageEnglish
    Title of host publicationConference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2018
    Number of pages2
    PublisherIEEE
    Publication date1 Jan 2018
    ISBN (Print)9781943580453
    DOIs
    Publication statusPublished - 1 Jan 2018
    Event2018 Conference on Lasers and Electro-Optics Pacific Rim - Hong Kong, China
    Duration: 29 Jul 20183 Aug 2018
    https://ieeexplore.ieee.org/xpl/conhome/8682150/proceeding

    Conference

    Conference2018 Conference on Lasers and Electro-Optics Pacific Rim
    Country/TerritoryChina
    CityHong Kong
    Period29/07/201803/08/2018
    Internet address

    Bibliographical note

    From the session: Infrared and Terahertz Microscopy and Nanoscopy and Their Applications (Tu3C)

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