Laser terahertz emission nanoscopy

Angela Pizzuto, Pernille Klarskov, Daniel M. Mittleman

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

We demonstrate depletion of terahertz emission from semiconductors by applying a DC bias between a substrate and an AFM probe operating in tapping mode. The depletion is strongly dependent on the probe tapping amplitude.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2018
Number of pages2
PublisherIEEE
Publication date1 Jan 2018
ISBN (Print)9781943580453
DOIs
Publication statusPublished - 1 Jan 2018
EventConference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2018 - Hong Kong, China
Duration: 29 Jul 20183 Aug 2018

Conference

ConferenceConference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2018
CountryChina
CityHong Kong
Period29/07/201803/08/2018

Bibliographical note

From the session: Infrared and Terahertz Microscopy and Nanoscopy and Their Applications (Tu3C)

Cite this

Pizzuto, A., Klarskov, P., & Mittleman, D. M. (2018). Laser terahertz emission nanoscopy. In Conference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2018 IEEE. https://doi.org/10.1364/CLEOPR.2018.Tu3C.2