Laser terahertz emission microscopy with near-field probes

Pernille Klarskov Pedersen; Daniel M. Mittleman

doi:10.1109/IRMMW-THz.2016.7758721

Laser terahertz emission microscopy with near-field probes

Pernille Klarskov Pedersen
, Daniel M. Mittleman

Brown University

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Abstract

Using an AFM, an optical near-field image at 800 nm of a dipole antenna for THz emission is measured, and by simultaneously collecting the emitted THz radiation, the laser light confined under the AFM probe gives a THz emission resolution of less than 50 nm.

Original language	English
Title of host publication	Proceedings of 2016 41st International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz),
Number of pages	2
Publisher	IEEE
Publication date	2016
Article number	7758721
ISBN (Print)	978-1-4673-8485-8
DOIs	https://doi.org/10.1109/IRMMW-THz.2016.7758721
Publication status	Published - 2016
Event	41st International Conference on Infrared, Millimeter and Terahertz Waves - Copenhagen, Denmark Duration: 25 Sept 2016 → 30 Sept 2016 Conference number: 41

Conference

Conference	41st International Conference on Infrared, Millimeter and Terahertz Waves
Number	41
Country/Territory	Denmark
City	Copenhagen
Period	25/09/2016 → 30/09/2016

Series	International Conference on Infrared, Millimeter and Terahertz Waves
ISSN	2162-2027

Keywords

Energy Engineering and Power Technology
Electrical and Electronic Engineering
Dipole antennas
Probes
AFM probe
Laser lights
Laser terahertz emission microscopies
Near field probes
Optical near field
THz emission
THz radiation
Terahertz waves
terahertz spectroscopy
atomic force microscopy
dipole antennas
probes
wavelength 800 nm
laser terahertz emission microscopy
near-field probes
optical near-field image
dipole antenna
emitted THz radiation
laser light
Laser beams
Surface emitting lasers
Gold
Microscopy
Measurement by laser beam
Optical spectroscopy and spectrometers
Scanning probe microscopy and related techniques
Single antennas

Access to Document

10.1109/IRMMW-THz.2016.7758721

OpenUrl availability

Check availability in DTU Findit

Cite this

@inproceedings{c214edf221a04c34a0807e7052a6ae96,

title = "Laser terahertz emission microscopy with near-field probes",

abstract = "Using an AFM, an optical near-field image at 800 nm of a dipole antenna for THz emission is measured, and by simultaneously collecting the emitted THz radiation, the laser light confined under the AFM probe gives a THz emission resolution of less than 50 nm.",

keywords = "Energy Engineering and Power Technology, Electrical and Electronic Engineering, Dipole antennas, Probes, AFM probe, Laser lights, Laser terahertz emission microscopies, Near field probes, Optical near field, THz emission, THz radiation, Terahertz waves, terahertz spectroscopy, atomic force microscopy, dipole antennas, probes, wavelength 800 nm, laser terahertz emission microscopy, near-field probes, optical near-field image, dipole antenna, emitted THz radiation, laser light, Laser beams, Surface emitting lasers, Gold, Microscopy, Measurement by laser beam, Optical spectroscopy and spectrometers, Scanning probe microscopy and related techniques, Single antennas",

author = "Pedersen, \{Pernille Klarskov\} and Mittleman, \{Daniel M.\}",

year = "2016",

doi = "10.1109/IRMMW-THz.2016.7758721",

language = "English",

isbn = "978-1-4673-8485-8",

series = " International Conference on Infrared, Millimeter and Terahertz Waves",

publisher = "IEEE",

booktitle = "Proceedings of 2016 41st International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz),",

address = "United States",

note = "41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016 ; Conference date: 25-09-2016 Through 30-09-2016",

}

Pedersen, PK & Mittleman, DM 2016, Laser terahertz emission microscopy with near-field probes. in Proceedings of 2016 41st International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz), ., 7758721, IEEE, International Conference on Infrared, Millimeter and Terahertz Waves, 41st International Conference on Infrared, Millimeter and Terahertz Waves, Copenhagen, Denmark, 25/09/2016. https://doi.org/10.1109/IRMMW-THz.2016.7758721

Laser terahertz emission microscopy with near-field probes. / Pedersen, Pernille Klarskov; Mittleman, Daniel M.
Proceedings of 2016 41st International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz), . IEEE, 2016. 7758721 ( International Conference on Infrared, Millimeter and Terahertz Waves).

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

TY - GEN

T1 - Laser terahertz emission microscopy with near-field probes

AU - Pedersen, Pernille Klarskov

AU - Mittleman, Daniel M.

N1 - Conference code: 41

PY - 2016

Y1 - 2016

N2 - Using an AFM, an optical near-field image at 800 nm of a dipole antenna for THz emission is measured, and by simultaneously collecting the emitted THz radiation, the laser light confined under the AFM probe gives a THz emission resolution of less than 50 nm.

AB - Using an AFM, an optical near-field image at 800 nm of a dipole antenna for THz emission is measured, and by simultaneously collecting the emitted THz radiation, the laser light confined under the AFM probe gives a THz emission resolution of less than 50 nm.

KW - Energy Engineering and Power Technology

KW - Electrical and Electronic Engineering

KW - Dipole antennas

KW - Probes

KW - AFM probe

KW - Laser lights

KW - Laser terahertz emission microscopies

KW - Near field probes

KW - Optical near field

KW - THz emission

KW - THz radiation

KW - Terahertz waves

KW - terahertz spectroscopy

KW - atomic force microscopy

KW - dipole antennas

KW - probes

KW - wavelength 800 nm

KW - laser terahertz emission microscopy

KW - near-field probes

KW - optical near-field image

KW - dipole antenna

KW - emitted THz radiation

KW - laser light

KW - Laser beams

KW - Surface emitting lasers

KW - Gold

KW - Microscopy

KW - Measurement by laser beam

KW - Optical spectroscopy and spectrometers

KW - Scanning probe microscopy and related techniques

KW - Single antennas

U2 - 10.1109/IRMMW-THz.2016.7758721

DO - 10.1109/IRMMW-THz.2016.7758721

M3 - Article in proceedings

SN - 978-1-4673-8485-8

T3 - International Conference on Infrared, Millimeter and Terahertz Waves

BT - Proceedings of 2016 41st International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz),

PB - IEEE

T2 - 41st International Conference on Infrared, Millimeter and Terahertz Waves

Y2 - 25 September 2016 through 30 September 2016

ER -

Laser terahertz emission microscopy with near-field probes

Abstract

Conference

Keywords

Access to Document

OpenUrl availability

Fingerprint

Cite this