Abstract
Using an AFM, an optical near-field image at 800 nm of a dipole antenna for THz emission is measured, and by simultaneously collecting the emitted THz radiation, the laser light confined under the AFM probe gives a THz emission resolution of less than 50 nm.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of 2016 41st International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz), |
| Number of pages | 2 |
| Publisher | IEEE |
| Publication date | 2016 |
| Article number | 7758721 |
| ISBN (Print) | 978-1-4673-8485-8 |
| DOIs | |
| Publication status | Published - 2016 |
| Event | 41st International Conference on Infrared, Millimeter and Terahertz Waves - Copenhagen, Denmark Duration: 25 Sept 2016 → 30 Sept 2016 Conference number: 41 |
Conference
| Conference | 41st International Conference on Infrared, Millimeter and Terahertz Waves |
|---|---|
| Number | 41 |
| Country/Territory | Denmark |
| City | Copenhagen |
| Period | 25/09/2016 → 30/09/2016 |
| Series | International Conference on Infrared, Millimeter and Terahertz Waves |
|---|---|
| ISSN | 2162-2027 |
Keywords
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering
- Dipole antennas
- Probes
- AFM probe
- Laser lights
- Laser terahertz emission microscopies
- Near field probes
- Optical near field
- THz emission
- THz radiation
- Terahertz waves
- terahertz spectroscopy
- atomic force microscopy
- dipole antennas
- probes
- wavelength 800 nm
- laser terahertz emission microscopy
- near-field probes
- optical near-field image
- dipole antenna
- emitted THz radiation
- laser light
- Laser beams
- Surface emitting lasers
- Gold
- Microscopy
- Measurement by laser beam
- Optical spectroscopy and spectrometers
- Scanning probe microscopy and related techniques
- Single antennas