Laser Induced Luminescence Characterization of Mechanically Stressed PV Cells

Gisele Alves dos Reis Benatto; Claire Mantel; Adrian Alejo Santamaria Lancia; Peter Behrensdorff Poulsen; Søren Forchhammer; Sergiu Viorel Spataru

doi:10.1109/PVSC43889.2021.9518751

Laser Induced Luminescence Characterization of Mechanically Stressed PV Cells

Gisele Alves dos Reis Benatto, Claire Mantel, Adrian Alejo Santamaria Lancia, Peter Behrensdorff Poulsen, Søren Forchhammer, Sergiu Viorel Spataru

Centre of Excellence for Silicon Photonics for Optical Communications

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

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Abstract

Electroluminescence (EL) and photoluminescence (PL) imaging are powerful solar cell and panel characterization techniques that are capable of detecting early stage solar cell failures and degradation with high sensitivity and level of detail required for proper preventive maintenance. The electrical contacts needed during measurement pose a challenge for many inspection scenarios, both for EL and PL. Light or Laser induced luminescence (LIL) is a contactless way to generate spatially resolved images of PV panels that highlight poorly connected cell areas, such as finger failures, areas with high series resistance or disconnected cell cracks. In this study, we analyze the characteristics of the LIL scan imaging method in detecting cracks in mono-Si cells, comparing single frames with reconstructed contactless EL images built with a full LIL scan image stack. A comparison between contactless EL generated by LIL and conventional contact EL is made, and finally an estimation of the required laser intensity for outdoor LIL is provided, in correlation to known contact EL performance during nighttime and daylight conditions.

Original language	English
Title of host publication	Proceedings of 48^th IEEE Photovoltaic Specialists Conference
Publisher	IEEE
Publication date	2021
Pages	1949-1953
ISBN (Print)	978-1-6654-3018-0
DOIs	https://doi.org/10.1109/PVSC43889.2021.9518751
Publication status	Published - 2021
Event	48^th IEEE Photovoltaic Specialists Conference - Virtual conference Duration: 20 Jun 2021 → 25 Jun 2021 https://ieee-pvsc.org/PVSC48/

Conference

Conference	48^th IEEE Photovoltaic Specialists Conference
Location	Virtual conference
Period	20/06/2021 → 25/06/2021
Internet address	https://ieee-pvsc.org/PVSC48/

Keywords

Electroluminescence
Photoluminescence
Reliability
Cell characterization
Fault detection

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10.1109/PVSC43889.2021.9518751

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title = "Laser Induced Luminescence Characterization of Mechanically Stressed PV Cells",

abstract = "Electroluminescence (EL) and photoluminescence (PL) imaging are powerful solar cell and panel characterization techniques that are capable of detecting early stage solar cell failures and degradation with high sensitivity and level of detail required for proper preventive maintenance. The electrical contacts needed during measurement pose a challenge for many inspection scenarios, both for EL and PL. Light or Laser induced luminescence (LIL) is a contactless way to generate spatially resolved images of PV panels that highlight poorly connected cell areas, such as finger failures, areas with high series resistance or disconnected cell cracks. In this study, we analyze the characteristics of the LIL scan imaging method in detecting cracks in mono-Si cells, comparing single frames with reconstructed contactless EL images built with a full LIL scan image stack. A comparison between contactless EL generated by LIL and conventional contact EL is made, and finally an estimation of the required laser intensity for outdoor LIL is provided, in correlation to known contact EL performance during nighttime and daylight conditions. ",

keywords = "Electroluminescence, Photoluminescence, Reliability, Cell characterization, Fault detection",

author = "Benatto, {Gisele Alves dos Reis} and Claire Mantel and {Santamaria Lancia}, {Adrian Alejo} and Poulsen, {Peter Behrensdorff} and S{\o}ren Forchhammer and Spataru, {Sergiu Viorel}",

year = "2021",

doi = "10.1109/PVSC43889.2021.9518751",

language = "English",

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pages = "1949--1953",

booktitle = "Proceedings of 48th IEEE Photovoltaic Specialists Conference",

publisher = "IEEE",

address = "United States",

note = "48<sup>th</sup> IEEE Photovoltaic Specialists Conference , PVSC 48 ; Conference date: 20-06-2021 Through 25-06-2021",

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}

Laser Induced Luminescence Characterization of Mechanically Stressed PV Cells. / Benatto, Gisele Alves dos Reis ; Mantel, Claire; Santamaria Lancia, Adrian Alejo et al.
Proceedings of 48^th IEEE Photovoltaic Specialists Conference. IEEE, 2021. p. 1949-1953.

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

TY - GEN

T1 - Laser Induced Luminescence Characterization of Mechanically Stressed PV Cells

AU - Benatto, Gisele Alves dos Reis

AU - Mantel, Claire

AU - Santamaria Lancia, Adrian Alejo

AU - Poulsen, Peter Behrensdorff

AU - Forchhammer, Søren

AU - Spataru, Sergiu Viorel

PY - 2021

Y1 - 2021

N2 - Electroluminescence (EL) and photoluminescence (PL) imaging are powerful solar cell and panel characterization techniques that are capable of detecting early stage solar cell failures and degradation with high sensitivity and level of detail required for proper preventive maintenance. The electrical contacts needed during measurement pose a challenge for many inspection scenarios, both for EL and PL. Light or Laser induced luminescence (LIL) is a contactless way to generate spatially resolved images of PV panels that highlight poorly connected cell areas, such as finger failures, areas with high series resistance or disconnected cell cracks. In this study, we analyze the characteristics of the LIL scan imaging method in detecting cracks in mono-Si cells, comparing single frames with reconstructed contactless EL images built with a full LIL scan image stack. A comparison between contactless EL generated by LIL and conventional contact EL is made, and finally an estimation of the required laser intensity for outdoor LIL is provided, in correlation to known contact EL performance during nighttime and daylight conditions.

AB - Electroluminescence (EL) and photoluminescence (PL) imaging are powerful solar cell and panel characterization techniques that are capable of detecting early stage solar cell failures and degradation with high sensitivity and level of detail required for proper preventive maintenance. The electrical contacts needed during measurement pose a challenge for many inspection scenarios, both for EL and PL. Light or Laser induced luminescence (LIL) is a contactless way to generate spatially resolved images of PV panels that highlight poorly connected cell areas, such as finger failures, areas with high series resistance or disconnected cell cracks. In this study, we analyze the characteristics of the LIL scan imaging method in detecting cracks in mono-Si cells, comparing single frames with reconstructed contactless EL images built with a full LIL scan image stack. A comparison between contactless EL generated by LIL and conventional contact EL is made, and finally an estimation of the required laser intensity for outdoor LIL is provided, in correlation to known contact EL performance during nighttime and daylight conditions.

KW - Electroluminescence

KW - Photoluminescence

KW - Reliability

KW - Cell characterization

KW - Fault detection

U2 - 10.1109/PVSC43889.2021.9518751

DO - 10.1109/PVSC43889.2021.9518751

M3 - Article in proceedings

SN - 978-1-6654-3018-0

SP - 1949

EP - 1953

BT - Proceedings of 48th IEEE Photovoltaic Specialists Conference

PB - IEEE

T2 - 48<sup>th</sup> IEEE Photovoltaic Specialists Conference

Y2 - 20 June 2021 through 25 June 2021

ER -

Laser Induced Luminescence Characterization of Mechanically Stressed PV Cells

Abstract

Conference

Keywords

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