Original language | English |
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Journal | Microscopy and Microanalysis |
Volume | 28 |
Issue number | S1 |
Pages (from-to) | 2984-2986 |
ISSN | 1431-9276 |
DOIs | |
Publication status | Published - 2022 |
Large-scale Automated Analysis of High-Resolution Transmission Electron Microscopy Data Assisted by Deep Learning Neural Networks
Matthew Helmi Leth Larsen, Cuauhtémoc Nuñez Valencia, William Bang Lomholdt, Daniel Kelly, Pei Liu, Jakob Birkedal Wagner, Ole Winther, Thomas Willum Hansen, Jakob Schiøtz
Research output: Contribution to journal › Conference abstract in journal › Research › peer-review
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