Large-scale Automated Analysis of High-Resolution Transmission Electron Microscopy Data Assisted by Deep Learning Neural Networks

Matthew Helmi Leth Larsen, Cuauhtémoc Nuñez Valencia, William Bang Lomholdt, Daniel Kelly, Pei Liu, Jakob Birkedal Wagner, Ole Winther, Thomas Willum Hansen, Jakob Schiøtz

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Original languageEnglish
JournalMicroscopy and Microanalysis
Volume28
Issue numberS1
Pages (from-to)2984-2986
ISSN1431-9276
DOIs
Publication statusPublished - 2022

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