Abstract
A laboratory-based 3D scanning X-ray scanning Laue micro-diffraction system and method for characterisation of crystalline materials, comprising: a focusing optic, a sample located at a distance from the focusing optic, a laboratory X-ray source, a stage to translate and rotate the sample, a detector arranged to detect the Laue diffraction patterns of the diffracted X-rays. The method comprising scanning each layer of the sample by translating the sample relatively to the focused beam at different rotations to illuminate each voxel in the layer in more than one rotation and indexing each voxel within the layer using the recorded Laue diffraction patterns at different rotations. By repeating the translation and rotation for different layers of the sample, a 3D image of the grain structure of the sample is reconstructed.
| Original language | English |
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| IPC | G01N 23/ 207 A I |
| Patent number | WO2022013127 |
| Filing date | 15/07/2020 |
| Country/Territory | International Bureau of the World Intellectual Property Organization (WIPO) |
| Priority date | 15/07/2020 |
| Priority number | EP20200186035 |
| Publication status | Published - 20 Jan 2022 |