JEM-X: The X-ray monitor on INTEGRAL

Niels Lund, Carl Budtz-Jørgensen, Niels Jørgen Stenfeldt Westergaard, Allan Hornstrup, Ib Lundgaard Rasmussen, Steen Laursen, René Kristensen, P.B. Mogensen, Knud Harboe Andersen, Ib Rasmussen, Jozef Polny, Peter Frederiksen, B. Lauridsen, K. Omo, P. Jonasson, V. Kamarinen, Toke Bech Andersson, O. Vilhu, J. Huovelin, E. CostaM. Feroci, A. Rubini, E. Morelli, A. Morbidini, F. Frontera, C. Zavattini, V. Carassiti, M. Morawski, G. Juchnikowski, V. Reglero, J. Peris, V. Collado, J.M. Rodrigo, F. Perez, J.L. Requena, S. Larsson, R. Svensson, A. Zdziarski, H.W. Schnopper

    Research output: Contribution to journalConference articleResearchpeer-review


    The INTEGRAL X-ray monitor, JEM-X, (together with the two gamma ray instruments, SPI and IBIS) will provide simultaneous imaging with arcminute angular resolution in the 3-60 keV band. The unique angular resolution and low energy response of JEM-X will play a crucial role in the detection and identification of gamma ray sources as well as in the analysis and scientific interpretation of the combined X-ray and gamma ray data. JEM-X is a coded aperture X-ray telescope consisting of two identical detectors. Each detector has a sensitive area of 500 cm(2), and views the sky (6.6 deg FOV, FWHM) through its own coded aperature mask. The coded cm masks are located 3.4 m above the detector windows. The detector field of view is constrained by X-ray collimators.
    Original languageEnglish
    JournalAstrophysical Letters & Communications
    Issue number1-6
    Pages (from-to)807-813
    Publication statusPublished - 1999
    Event3rd Integral Workshop on the Extreme Universe - Taromina, Italy
    Duration: 14 Sep 199818 Sep 1998
    Conference number: 3


    Conference3rd Integral Workshop on the Extreme Universe


    • sensitivity
    • X-ray astronomy
    • JEM-X


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