JEM-X: The X-ray monitor on INTEGRAL

Carl Budtz-Jørgensen, Niels Lund, Niels Jørgen Stenfeldt Westergaard, Søren Kristian Brandt, Allan Hornstrup, Ib Lundgaard Rasmussen, Steen Laursen, S.M. Pedersen, R.E. Kristensen, P.B. Mogensen, K.H. Andersen, Ib Lundgaard Rasmussen, Jozef Polny, Poul Anker Jensen, Carol Anne Oxborrow, Jérôme Chenevez, K. Omoe, V.J. Kämäräinen, Toke Bech Andersson, O.R. VilhuJ. Huovelin, E. Costa, M. Feroci, A. Rubini, E. Morelli, A. Morbidini, F. Frontera, C. Pelliciari, G. Loffredo, G. Zavattini, V. Carassiti, M. Morawski, G. Juchnikowski, V. Reglero, J. Peris, V. Collado, J.M. Rodirgo, F. Perez, J.L. Requena, S. Larsson, R. Svensson, A. Zdziarski, A.J. Castro-Tirado, H.W. Schnopper

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

The INTEGRAL X-ray monitor, JEM-X, (together with the two gamma ray instruments, SPI and IBIS) provides simultaneous imaging with arcminute angular resolution in the 3-35 keV band. The good angular resolution and low energy response of JEM-X plays an important role in the detection and identification of gamma ray sources as well as in the analysis and scientific interpretation of the combined X-ray and gamma ray data. JEM-X is a coded aperture X-ray telescope consisting of two identical detectors. Each detector has a sensitive area of 500 cm(2), and views the sky through its own coded aperture mask. The coded masks are located 3.4 m above the detector windows. The detector field of view is constrained by X-ray collimators (6.6degrees FOV, FWHM).
Original languageEnglish
Title of host publicationX-ray and Gamma-ray Instumentation for Astronomy XIII
EditorsKathryn A Flanagan, Oswald H. W Siegmund
Publication date2004
Pages139-150
ISBN (Print)0-8194-5038-3
DOIs
Publication statusPublished - 2004
EventX-ray and Gamma-ray Instrumentation for Astronomy XIII - San Diego, CA, United States
Duration: 3 Aug 20035 Aug 2003

Conference

ConferenceX-ray and Gamma-ray Instrumentation for Astronomy XIII
CountryUnited States
CitySan Diego, CA
Period03/08/200305/08/2003
SeriesProceedings of SPIE, the International Society for Optical Engineering
Volume5165
ISSN0277-786X

Keywords

  • JEM-X
  • INTEGRAL
  • X-ray astronomy
  • micro strip detector

Cite this

Budtz-Jørgensen, C., Lund, N., Westergaard, N. J. S., Brandt, S. K., Hornstrup, A., Rasmussen, I. L., Laursen, S., Pedersen, S. M., Kristensen, R. E., Mogensen, P. B., Andersen, K. H., Rasmussen, I. L., Polny, J., Jensen, P. A., Oxborrow, C. A., Chenevez, J., Omoe, K., Kämäräinen, V. J., Andersson, T. B., ... Schnopper, H. W. (2004). JEM-X: The X-ray monitor on INTEGRAL. In K. A. Flanagan, & O. H. W. Siegmund (Eds.), X-ray and Gamma-ray Instumentation for Astronomy XIII (pp. 139-150). Proceedings of SPIE, the International Society for Optical Engineering, Vol.. 5165 https://doi.org/10.1117/12.506791