JEM-X: The X-ray monitor on INTEGRAL

Carl Budtz-Jørgensen; Niels Lund; Niels Jørgen Stenfeldt Westergaard; Søren Kristian Brandt; Allan Hornstrup; Ib Lundgaard Rasmussen; Steen Laursen; S.M. Pedersen; R.E. Kristensen; P.B. Mogensen; K.H. Andersen; Ib Lundgaard Rasmussen; Jozef Polny; Poul Anker Jensen; Carol Anne Oxborrow; Jérôme Chenevez; K. Omoe; V.J. Kämäräinen; Toke Bech Andersson; O.R. Vilhu; J. Huovelin; E. Costa; M. Feroci; A. Rubini; E. Morelli; A. Morbidini; F. Frontera; C. Pelliciari; G. Loffredo; G. Zavattini; V. Carassiti; M. Morawski; G. Juchnikowski; V. Reglero; J. Peris; V. Collado; J.M. Rodirgo; F. Perez; J.L. Requena; S. Larsson; R. Svensson; A. Zdziarski; A.J. Castro-Tirado; H.W. Schnopper

doi:10.1117/12.506791

JEM-X: The X-ray monitor on INTEGRAL

Carl Budtz-Jørgensen, Niels Lund, Niels Jørgen Stenfeldt Westergaard, Søren Kristian Brandt, Allan Hornstrup, Ib Lundgaard Rasmussen, Steen Laursen, S.M. Pedersen, R.E. Kristensen, P.B. Mogensen, K.H. Andersen, Ib Lundgaard Rasmussen, Jozef Polny, Poul Anker Jensen, Carol Anne Oxborrow, Jérôme Chenevez, K. Omoe, V.J. Kämäräinen, Toke Bech Andersson, O.R. VilhuJ. Huovelin, E. Costa, M. Feroci, A. Rubini, E. Morelli, A. Morbidini, F. Frontera, C. Pelliciari, G. Loffredo, G. Zavattini, V. Carassiti, M. Morawski, G. Juchnikowski, V. Reglero, J. Peris, V. Collado, J.M. Rodirgo, F. Perez, J.L. Requena, S. Larsson, R. Svensson, A. Zdziarski, A.J. Castro-Tirado, H.W. Schnopper

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Abstract

The INTEGRAL X-ray monitor, JEM-X, (together with the two gamma ray instruments, SPI and IBIS) provides simultaneous imaging with arcminute angular resolution in the 3-35 keV band. The good angular resolution and low energy response of JEM-X plays an important role in the detection and identification of gamma ray sources as well as in the analysis and scientific interpretation of the combined X-ray and gamma ray data. JEM-X is a coded aperture X-ray telescope consisting of two identical detectors. Each detector has a sensitive area of 500 cm(2), and views the sky through its own coded aperture mask. The coded masks are located 3.4 m above the detector windows. The detector field of view is constrained by X-ray collimators (6.6degrees FOV, FWHM).

Original language	English
Title of host publication	X-ray and Gamma-ray Instumentation for Astronomy XIII
Editors	Kathryn A Flanagan, Oswald H. W Siegmund
Publication date	2004
Pages	139-150
ISBN (Print)	0-8194-5038-3
DOIs	https://doi.org/10.1117/12.506791
Publication status	Published - 2004
Event	X-ray and Gamma-ray Instrumentation for Astronomy XIII - San Diego, CA, United States Duration: 3 Aug 2003 → 5 Aug 2003

Conference

Conference	X-ray and Gamma-ray Instrumentation for Astronomy XIII
Country/Territory	United States
City	San Diego, CA
Period	03/08/2003 → 05/08/2003

Series	Proceedings of SPIE - The International Society for Optical Engineering
ISSN	0277-786X

Keywords

JEM-X
INTEGRAL
X-ray astronomy
micro strip detector

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10.1117/12.506791

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Budtz-Jørgensen, C., Lund, N., Westergaard, N. J. S., Brandt, S. K., Hornstrup, A., Rasmussen, I. L., Laursen, S., Pedersen, S. M., Kristensen, R. E., Mogensen, P. B., Andersen, K. H., Rasmussen, I. L., Polny, J., Jensen, P. A., Oxborrow, C. A., Chenevez, J., Omoe, K., Kämäräinen, V. J., Andersson, T. B., ... Schnopper, H. W. (2004). JEM-X: The X-ray monitor on INTEGRAL. In K. A. Flanagan, & O. H. W. Siegmund (Eds.), X-ray and Gamma-ray Instumentation for Astronomy XIII (pp. 139-150) https://doi.org/10.1117/12.506791

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title = "JEM-X: The X-ray monitor on INTEGRAL",

abstract = "The INTEGRAL X-ray monitor, JEM-X, (together with the two gamma ray instruments, SPI and IBIS) provides simultaneous imaging with arcminute angular resolution in the 3-35 keV band. The good angular resolution and low energy response of JEM-X plays an important role in the detection and identification of gamma ray sources as well as in the analysis and scientific interpretation of the combined X-ray and gamma ray data. JEM-X is a coded aperture X-ray telescope consisting of two identical detectors. Each detector has a sensitive area of 500 cm(2), and views the sky through its own coded aperture mask. The coded masks are located 3.4 m above the detector windows. The detector field of view is constrained by X-ray collimators (6.6degrees FOV, FWHM).",

keywords = " JEM-X, INTEGRAL, X-ray astronomy, micro strip detector",

author = "Carl Budtz-J{\o}rgensen and Niels Lund and Westergaard, {Niels J{\o}rgen Stenfeldt} and Brandt, {S{\o}ren Kristian} and Allan Hornstrup and Rasmussen, {Ib Lundgaard} and Steen Laursen and S.M. Pedersen and R.E. Kristensen and P.B. Mogensen and K.H. Andersen and Rasmussen, {Ib Lundgaard} and Jozef Polny and Jensen, {Poul Anker} and Oxborrow, {Carol Anne} and J{\'e}r{\^o}me Chenevez and K. Omoe and V.J. K{\"a}m{\"a}r{\"a}inen and Andersson, {Toke Bech} and O.R. Vilhu and J. Huovelin and E. Costa and M. Feroci and A. Rubini and E. Morelli and A. Morbidini and F. Frontera and C. Pelliciari and G. Loffredo and G. Zavattini and V. Carassiti and M. Morawski and G. Juchnikowski and V. Reglero and J. Peris and V. Collado and J.M. Rodirgo and F. Perez and J.L. Requena and S. Larsson and R. Svensson and A. Zdziarski and A.J. Castro-Tirado and H.W. Schnopper",

year = "2004",

doi = "10.1117/12.506791",

language = "English",

isbn = "0-8194-5038-3",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE",

pages = "139--150",

editor = "Flanagan, {Kathryn A} and Siegmund, {Oswald H. W}",

booktitle = "X-ray and Gamma-ray Instumentation for Astronomy XIII",

note = "X-ray and Gamma-ray Instrumentation for Astronomy XIII ; Conference date: 03-08-2003 Through 05-08-2003",

}

Budtz-Jørgensen, C , Lund, N, Westergaard, NJS, Brandt, SK , Hornstrup, A , Rasmussen, IL, Laursen, S, Pedersen, SM, Kristensen, RE, Mogensen, PB, Andersen, KH, Rasmussen, IL , Polny, J, Jensen, PA, Oxborrow, CA , Chenevez, J, Omoe, K, Kämäräinen, VJ, Andersson, TB, Vilhu, OR, Huovelin, J, Costa, E, Feroci, M, Rubini, A, Morelli, E, Morbidini, A, Frontera, F, Pelliciari, C, Loffredo, G, Zavattini, G, Carassiti, V, Morawski, M, Juchnikowski, G, Reglero, V, Peris, J, Collado, V, Rodirgo, JM, Perez, F, Requena, JL, Larsson, S, Svensson, R, Zdziarski, A, Castro-Tirado, AJ & Schnopper, HW 2004, JEM-X: The X-ray monitor on INTEGRAL. in KA Flanagan & OHW Siegmund (eds), X-ray and Gamma-ray Instumentation for Astronomy XIII. Proceedings of SPIE - The International Society for Optical Engineering, pp. 139-150, X-ray and Gamma-ray Instrumentation for Astronomy XIII, San Diego, CA, United States, 03/08/2003. https://doi.org/10.1117/12.506791

JEM-X: The X-ray monitor on INTEGRAL. / Budtz-Jørgensen, Carl ; Lund, Niels; Westergaard, Niels Jørgen Stenfeldt et al.
X-ray and Gamma-ray Instumentation for Astronomy XIII. ed. / Kathryn A Flanagan; Oswald H. W Siegmund. 2004. p. 139-150 (Proceedings of SPIE - The International Society for Optical Engineering).

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

TY - GEN

T1 - JEM-X: The X-ray monitor on INTEGRAL

AU - Budtz-Jørgensen, Carl

AU - Lund, Niels

AU - Westergaard, Niels Jørgen Stenfeldt

AU - Brandt, Søren Kristian

AU - Hornstrup, Allan

AU - Rasmussen, Ib Lundgaard

AU - Laursen, Steen

AU - Pedersen, S.M.

AU - Kristensen, R.E.

AU - Mogensen, P.B.

AU - Andersen, K.H.

AU - Rasmussen, Ib Lundgaard

AU - Polny, Jozef

AU - Jensen, Poul Anker

AU - Oxborrow, Carol Anne

AU - Chenevez, Jérôme

AU - Omoe, K.

AU - Kämäräinen, V.J.

AU - Andersson, Toke Bech

AU - Vilhu, O.R.

AU - Huovelin, J.

AU - Costa, E.

AU - Feroci, M.

AU - Rubini, A.

AU - Morelli, E.

AU - Morbidini, A.

AU - Frontera, F.

AU - Pelliciari, C.

AU - Loffredo, G.

AU - Zavattini, G.

AU - Carassiti, V.

AU - Morawski, M.

AU - Juchnikowski, G.

AU - Reglero, V.

AU - Peris, J.

AU - Collado, V.

AU - Rodirgo, J.M.

AU - Perez, F.

AU - Requena, J.L.

AU - Larsson, S.

AU - Svensson, R.

AU - Zdziarski, A.

AU - Castro-Tirado, A.J.

AU - Schnopper, H.W.

PY - 2004

Y1 - 2004

N2 - The INTEGRAL X-ray monitor, JEM-X, (together with the two gamma ray instruments, SPI and IBIS) provides simultaneous imaging with arcminute angular resolution in the 3-35 keV band. The good angular resolution and low energy response of JEM-X plays an important role in the detection and identification of gamma ray sources as well as in the analysis and scientific interpretation of the combined X-ray and gamma ray data. JEM-X is a coded aperture X-ray telescope consisting of two identical detectors. Each detector has a sensitive area of 500 cm(2), and views the sky through its own coded aperture mask. The coded masks are located 3.4 m above the detector windows. The detector field of view is constrained by X-ray collimators (6.6degrees FOV, FWHM).

AB - The INTEGRAL X-ray monitor, JEM-X, (together with the two gamma ray instruments, SPI and IBIS) provides simultaneous imaging with arcminute angular resolution in the 3-35 keV band. The good angular resolution and low energy response of JEM-X plays an important role in the detection and identification of gamma ray sources as well as in the analysis and scientific interpretation of the combined X-ray and gamma ray data. JEM-X is a coded aperture X-ray telescope consisting of two identical detectors. Each detector has a sensitive area of 500 cm(2), and views the sky through its own coded aperture mask. The coded masks are located 3.4 m above the detector windows. The detector field of view is constrained by X-ray collimators (6.6degrees FOV, FWHM).

KW - JEM-X

KW - INTEGRAL

KW - X-ray astronomy

KW - micro strip detector

U2 - 10.1117/12.506791

DO - 10.1117/12.506791

M3 - Article in proceedings

SN - 0-8194-5038-3

T3 - Proceedings of SPIE - The International Society for Optical Engineering

SP - 139

EP - 150

BT - X-ray and Gamma-ray Instumentation for Astronomy XIII

A2 - Flanagan, Kathryn A

A2 - Siegmund, Oswald H. W

T2 - X-ray and Gamma-ray Instrumentation for Astronomy XIII

Y2 - 3 August 2003 through 5 August 2003

ER -

JEM-X: The X-ray monitor on INTEGRAL

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Keywords

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