JEM-X: The X-ray monitor on INTEGRAL

Carl Budtz-Jørgensen, Niels Lund, Niels Jørgen Stenfeldt Westergaard, Søren Kristian Brandt, Allan Hornstrup, Ib Lundgaard Rasmussen, Steen Laursen, S.M. Pedersen, R.E. Kristensen, P.B. Mogensen, K.H. Andersen, Ib Lundgaard Rasmussen, Jozef Polny, Poul Anker Jensen, Carol Anne Oxborrow, Jérôme Chenevez, K. Omoe, V.J. Kämäräinen, Toke Bech Andersson, O.R. VilhuJ. Huovelin, E. Costa, M. Feroci, A. Rubini, E. Morelli, A. Morbidini, F. Frontera, C. Pelliciari, G. Loffredo, G. Zavattini, V. Carassiti, M. Morawski, G. Juchnikowski, V. Reglero, J. Peris, V. Collado, J.M. Rodirgo, F. Perez, J.L. Requena, S. Larsson, R. Svensson, A. Zdziarski, A.J. Castro-Tirado, H.W. Schnopper

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review


    The INTEGRAL X-ray monitor, JEM-X, (together with the two gamma ray instruments, SPI and IBIS) provides simultaneous imaging with arcminute angular resolution in the 3-35 keV band. The good angular resolution and low energy response of JEM-X plays an important role in the detection and identification of gamma ray sources as well as in the analysis and scientific interpretation of the combined X-ray and gamma ray data. JEM-X is a coded aperture X-ray telescope consisting of two identical detectors. Each detector has a sensitive area of 500 cm(2), and views the sky through its own coded aperture mask. The coded masks are located 3.4 m above the detector windows. The detector field of view is constrained by X-ray collimators (6.6degrees FOV, FWHM).
    Original languageEnglish
    Title of host publicationX-ray and Gamma-ray Instumentation for Astronomy XIII
    EditorsKathryn A Flanagan, Oswald H. W Siegmund
    Publication date2004
    ISBN (Print)0-8194-5038-3
    Publication statusPublished - 2004
    EventX-ray and Gamma-ray Instrumentation for Astronomy XIII - San Diego, CA, United States
    Duration: 3 Aug 20035 Aug 2003


    ConferenceX-ray and Gamma-ray Instrumentation for Astronomy XIII
    Country/TerritoryUnited States
    CitySan Diego, CA
    SeriesProceedings of SPIE - The International Society for Optical Engineering


    • JEM-X
    • X-ray astronomy
    • micro strip detector


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