Irradiation Induced Dislocation Climb Sources

Torben Leffers, P. Barlow

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research

Original language	English
Title of host publication	Microscopie Electronique á Haute Tension
Editors	B. Jouffrey, P Farvard
Place of Publication	Paris
Publisher	Societe Francaise de Microscopie Electronique
Publication date	1976
Pages	201-204
Publication status	Published - 1976
Event	Congres International : Microscopie Electronique á Haute Tension - Toulouse, 1-4 September Duration: 1 Jan 1975 → … Conference number: 4

Conference	Congres International : Microscopie Electronique á Haute Tension
Number	4
City	Toulouse, 1-4 September
Period	01/01/1975 → …

Cite this

@inproceedings{2d9828895989408eb1520f4c1b15d04d,

title = "Irradiation Induced Dislocation Climb Sources",

author = "Torben Leffers and P. Barlow",

year = "1976",

language = "English",

pages = "201--204",

editor = "B. Jouffrey and P Farvard",

booktitle = "Microscopie Electronique {\'a} Haute Tension",

publisher = "Societe Francaise de Microscopie Electronique",

note = "Congres International : Microscopie Electronique {\'a} Haute Tension ; Conference date: 01-01-1975",

}

TY - GEN

T1 - Irradiation Induced Dislocation Climb Sources

AU - Leffers, Torben

AU - Barlow, P.

N1 - Conference code: 4

PY - 1976

Y1 - 1976

M3 - Article in proceedings

SP - 201

EP - 204

BT - Microscopie Electronique á Haute Tension

A2 - Jouffrey, B.

A2 - Farvard, P

PB - Societe Francaise de Microscopie Electronique

CY - Paris

T2 - Congres International : Microscopie Electronique á Haute Tension

Y2 - 1 January 1975

ER -