Invited paper: Characterization of few mode fibers and devices

Lars Grüner-Nielsen; Neethu Mariam Mathew; Karsten Rottwitt

doi:10.1016/j.yofte.2019.101972

Invited paper: Characterization of few mode fibers and devices

Lars Grüner-Nielsen^* (Invited author), Neethu Mariam Mathew (Invited author), Karsten Rottwitt (Invited author)

^*Corresponding author for this work

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

This paper reviews characterization techniques for few mode fibers and components. The focus is on interferometric techniques including spatial and spectral resolved imaging (S²). Simple interferometric measurements are shown to be able to give quite comprehensive information including measurement of relative group delay. A new improved algorithm for analyzing S² data for the case of only two modes is presented. The effect of polarization and rotation of asymmetric modes is treated as well.

Original language	English
Article number	101972
Journal	Optical Fiber Technology
Volume	52
ISSN	1068-5200
DOIs	https://doi.org/10.1016/j.yofte.2019.101972
Publication status	Published - 1 Nov 2019

Keywords

Few mode fibers
Interference
Optical fiber measurements

Access to Document

10.1016/j.yofte.2019.101972

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Paper OFT invited Revised
Accepted author manuscript, 3.25 MB
Licence: CC BY-NC-ND
Embargo ends: 31/07/2021

Cite this

Grüner-Nielsen, L., Mathew, N. M., & Rottwitt, K. (2019). Invited paper: Characterization of few mode fibers and devices. Optical Fiber Technology, 52, [101972]. https://doi.org/10.1016/j.yofte.2019.101972

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