Investigation of Top/Bottom electrode and Diffusion Barrier Layer for PZT Thick Film MEMS Sensors

Christian Carstensen Hindrichsen, Thomas Pedersen, Erik Vilain Thomsen

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    Top and bottom electrodes for screen printed piezoelectric lead zirconate titanate, Pb(ZrxTi1 - x)O3 (PZT) thick film are investigated with respect to future MEMS devices. Down to 100 nm thick E-beam evaporated Al and Pt films are patterned as top electrodes on the PZT using a lift-off process with a line width down to 3 μ m. A 700 nm thick ZrO2 layer as insolating diffusion barrier layer is found to be insufficient as barrier layer for PZT on a silicon substrate sintered at 850°C. EDX shows diffusion of Si into the PZT layer.
    Original languageEnglish
    JournalFerroelectrics
    Volume367
    Issue number1
    Pages (from-to)201-213
    ISSN0015-0193
    DOIs
    Publication statusPublished - 2008

    Keywords

    • PZT thick film
    • top electrode
    • bottom electrode
    • MEMS
    • accelerometer
    • pMUT″

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