Investigation of Pt Diffusion into SnPb(60/40) Solder by SIMS Profiling from the Backside

C.-H. Chiang, Jochen Friedrich Kuhmann, P. Harde, F. Reier, W. Österle

    Research output: Chapter in Book/Report/Conference proceedingBook chapterResearchpeer-review

    Original languageEnglish
    Title of host publicationMicroMat '97
    Publication date1997
    Pages874-877
    Publication statusPublished - 1997
    Event2nd International Conference and Exhibition Micro Materials - Berlin, Germany
    Duration: 16 Apr 199718 Apr 1997
    Conference number: 2

    Conference

    Conference2nd International Conference and Exhibition Micro Materials
    Number2
    CountryGermany
    CityBerlin
    Period16/04/199718/04/1997

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