Investigation of medium to high strain deformation microstructures using an automated electron backscattering pattern (EBSP) system

A. Godfrey, N.C. Krieger Lassen, D.A. Hughes, D. Juul Jensen

    Research output: Contribution to conferenceConference abstract for conferenceResearch

    Original languageEnglish
    Publication date1998
    Publication statusPublished - 1998
    EventMicroscopy and microanalysis '98 - Atlanta, GA (US), 12-16 Jul
    Duration: 1 Jan 1998 → …

    Conference

    ConferenceMicroscopy and microanalysis '98
    CityAtlanta, GA (US), 12-16 Jul
    Period01/01/1998 → …

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