Investigation of LO-leakage cancellation and DC-offset influence on flicker-noise in X-band mixers

Rasmus Michaelsen, Tom Johansen, Kjeld Tamborg

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Abstract

This paper describes an investigation on the influences in 1/f noise of LO-leakage and DC-offset cancellation for X-band mixers. Conditions for LO-leakage cancellation and zero DC-offset is derived. Measurements on a double balanced diode mixer shows an improvement in noise figure from 14.3dB to 12.1dB at 10KHz, while maintaining a noise figure of 6.2dB at 1MHz. LO-RF isolation is improved from 18dB to 60dB. The 1/f noise is shown to increase with increasing DC-offset.
Original languageEnglish
Title of host publicationProceedings of the 7th European Microwave Integrated Circuits Conference
PublisherIEEE
Publication date2012
Pages99-102
ISBN (Print)978-2-87487-028-6
Publication statusPublished - 2012
Event2012 European Microwave Integrated Circuit Conference - Amsterdam, Netherlands
Duration: 29 Oct 201230 Oct 2012

Conference

Conference2012 European Microwave Integrated Circuit Conference
CountryNetherlands
CityAmsterdam
Period29/10/201230/10/2012

Keywords

  • 1/f noise
  • Mixers
  • Receivers

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