Interlaboratory Comparison for Temporal Light Modulation Measurement

Yoshi Ohno, Steve Coyne, Jun-Seok Oh, Carsten Dam-Hansen, Michael Scholand, Jiaye Li, Gillian Isoardi

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

The International Energy Agency (IEA) 4E SSL Annex has conducted an Interlaboratory Comparison (IC 2023) for the measurement of temporal light modulation (TLM) of solid-state lighting (SSL) products. Designed to meet proficiency testing requirements, IC 2023 compared measured TLM quantities of short-term flicker indicator (PstLM) and stroboscopic effect visibility measure (SVM, MVS), as well as three other TLM quantities, of four comparison LED lamp artefacts. A comparison between the four Nucleus Laboratories was first conducted to establish reference values. The IC 2023 main round had 18 labs participate worldwide. The results showed much larger variations than expected. Analysis of the results identified the need for more robust test methods, with improvement in required performance specifications for TLM instruments, test equipment, and guidance on determining measurement uncertainties.
Original languageEnglish
Title of host publicationProceedings of 2024 IEEE Sustainable Smart Lighting World Conference & Expo
Number of pages4
PublisherIEEE
Publication date14 Nov 2024
Article number10881501
ISBN (Print)979-8-3315-4020-3
DOIs
Publication statusPublished - 14 Nov 2024
Event2024 IEEE Sustainable Smart Lighting World Conference - Eindhoven University of Technology, Eindhoven, Netherlands
Duration: 12 Nov 202414 Nov 2024
https://www.ssleindhoven.com/home

Conference

Conference2024 IEEE Sustainable Smart Lighting World Conference
LocationEindhoven University of Technology
Country/TerritoryNetherlands
CityEindhoven
Period12/11/202414/11/2024
Internet address

Keywords

  • Support vector machines
  • Solid state lighting
  • Uncertainty
  • Atmospheric measurements
  • Instruments
  • Measurement uncertainty
  • Laboratories
  • Modulation
  • Particle measurements
  • Test equipment

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