Interface Orientation Distribution during Grain Growth in Bulk SrTiO3 Measured by Means of 3D X-Ray Diffraction Contrast Tomography

Melanie Syha, Wolfgang Rheinheimer, Michael Bäurer, Erik Mejdal Lauridsen, Wolfgang Ludwig, Daniel Weygand, Peter Gumbsch

Research output: Contribution to journalConference articleResearchpeer-review

Abstract

3D x-ray diffraction contrast tomography (DCT) is a non-destructive technique for the determination of grain shape and crystallography in polycrystalline bulk materials. Using this technique, a strontium titanate specimen was repeatedly measured between annealing steps.. A systematic analysis of the growth history of selected grains before and after the ex-situ annealing step allows to extract the topological and morphological changes during grain growth. Furthermore, misorientation as well as interface orientation information of the microstructure reconstructions have been determined. The interface normal distribution clearly shows a preference for (100) oriented interfaces in the selected grains when annealed at 1600°C. This observation can be connected to existent interfacial energy estimations resulting from capillarity vector reconstructions. © 2012 Materials Research Society.
Original languageEnglish
JournalMaterials Research Society Symposium Proceedings
Volume1421
ISSN0272-9172
DOIs
Publication statusPublished - 2012
Event2011 MRS Fall Meeting & Exhibit - Boston, United States
Duration: 28 Nov 20112 Dec 2011

Conference

Conference2011 MRS Fall Meeting & Exhibit
Country/TerritoryUnited States
CityBoston
Period28/11/201102/12/2011

Keywords

  • Annealing
  • Crystallography
  • Nondestructive examination
  • Normal distribution
  • Strontium titanates
  • Three dimensional
  • Three dimensional computer graphics
  • Tomography
  • X ray diffraction
  • Grain growth

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