Integration of dynamic model and classification methods for fault detection and diagnosis in a chiller

José Joaquín Aguilera*, Wiebke Meesenburg, Andreas Schulte, Wiebke B. Markussen, Torben Schmidt Ommen, Benjamin Zühlsdorf, Jonas Lundsted Poulsen, Sven Försterling, Brian Elmegaard

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

Fault detection and diagnosis techniques can contribute to the reduction of operational costs, downtime periods and increase of component lifetime in vapour compression systems. In this study, a dynamic simulation model was developed to represent different operational points of an experimental chiller, namely fault-free operation, condenser fouling, refrigerant leakage and reduced condenser water flow rate. Simulated operational data allowed the use of four classification methods, namely logistic regression, naïve Bayes, decision tree and random forest. The results showed that the proposed framework was able to predict 94 % of faulty and fault-free operational points of the chiller when logistic regression was used. Fault prevention from the implementation of this framework was estimated to increase the average COP of the chiller by nearly 4 %. This study indicated the possibility to induce faults in dynamic simulation models combined with classification algorithms for fault detection and diagnosis in vapour compression systems.
Original languageEnglish
Title of host publication15th IIR-Gustav Lorentzen Conference on Natural Refrigerants (GL2022) : Proceedings
Number of pages14
PublisherInternational Institute of Refrigeration
Publication date2022
DOIs
Publication statusPublished - 2022
Event15th IIR-Gustav Lorentzen Conference on Natural Refrigerants - Trondheim, Norway
Duration: 13 Jun 202215 Jun 2022

Conference

Conference15th IIR-Gustav Lorentzen Conference on Natural Refrigerants
Country/TerritoryNorway
CityTrondheim
Period13/06/202215/06/2022
SeriesScience et Technique du Froid
ISSN0151-1637

Keywords

  • Fault detection
  • Fault diagnosis
  • Dynamic model
  • Vapour compression
  • Machine learning

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