Fault detection and isolation, (FDI) of parametric faults in dynamic systems will be considered in this paper. An active fault diagnosis (AFD) approach is applied. The fault diagnosis will be investigated with respect to different information levels from the external inputs to the systems. These inputs are disturbance inputs, reference inputs and auxilary inputs. The diagnosis of the system is derived by an evaluation of the signature from the inputs in the residual outputs. The changes of the signatures form the external inputs are used for detection and isolation of the parametric faults.
|Title of host publication||Proceedings of the 17th World Congress|
|Publication status||Published - 2008|
|Event||17th World Congress, The Internation Federation of Automatic Control - Seoul, Korea|
Duration: 1 Jan 2008 → …
|Conference||17th World Congress, The Internation Federation of Automatic Control|
|Period||01/01/2008 → …|
- Active fault diagnosis