Abstract
Fault detection and isolation, (FDI) of parametric faults in dynamic systems will be considered in this paper. An active fault diagnosis (AFD) approach is applied. The fault diagnosis will be investigated with respect to different information levels from the external inputs to the systems. These inputs are disturbance inputs, reference inputs and auxilary inputs. The diagnosis of the system is derived by an evaluation of the signature from the inputs in the residual outputs. The changes of the signatures form the external inputs are used for detection and isolation of the parametric faults.
Original language | English |
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Title of host publication | Proceedings of the 17th World Congress |
Publication date | 2008 |
Pages | 8890-8895 |
Publication status | Published - 2008 |
Event | 17th World Congress International Federation of Automatic Control - Seoul, Korea, Republic of Duration: 6 Jul 2008 → 11 Jul 2008 Conference number: 17 |
Conference
Conference | 17th World Congress International Federation of Automatic Control |
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Number | 17 |
Country/Territory | Korea, Republic of |
City | Seoul |
Period | 06/07/2008 → 11/07/2008 |
Keywords
- Active fault diagnosis