Influence of subsurface electrical field on X-ray microanalysis in YSZ

Yi-Lin Liu, Jørgen Bilde-Sørensen

    Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearch

    Original languageEnglish
    Title of host publication7. European workshop on modern developments and applications in microbeam analysis. Book of abstracts
    Number of pages345
    Place of PublicationTampere
    PublisherFinnish Society for Electron Microscopy
    Publication date2001
    Publication statusPublished - 2001
    EventEMAS 2001 - Tampere (FI), 6-10 May
    Duration: 1 Jan 2001 → …


    ConferenceEMAS 2001
    CityTampere (FI), 6-10 May
    Period01/01/2001 → …

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