Influence of probe geometry on the response of an electrostatic probe

Torben Johansson; George C Crichton; Iain Wilson McAllister

doi:10.1109/CEIDP.1999.804610

Influence of probe geometry on the response of an electrostatic probe

Torben Johansson, George C Crichton, Iain Wilson McAllister

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

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Abstract

The response of an electrostatic probe is examined with reference to the probe geometry. The study involves the evaluation of the probe lambda function, from which response-related characteristic parameters can be derived. These parameters enable the probe detection sensitivity Se and spatial selectivity Sp to be quantitatively assessed.

Original language	English
Title of host publication	1999 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, IEEE Publication 99CH36319
Place of Publication	New York
Publisher	IEEE
Publication date	1999
Pages	137-141
ISBN (Print)	0-7803-5414-1
DOIs	https://doi.org/10.1109/CEIDP.1999.804610
Publication status	Published - 1999
Event	Conference on Electrical Insulation and Dielectric Phenomena 1999 - Austin, TX, United States Duration: 17 Oct 1999 → 20 Oct 1999 http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6531

Conference

Conference	Conference on Electrical Insulation and Dielectric Phenomena 1999
Country/Territory	United States
City	Austin, TX
Period	17/10/1999 → 20/10/1999
Internet address	http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6531

Bibliographical note

Copyright 1999 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

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title = "Influence of probe geometry on the response of an electrostatic probe",

abstract = "The response of an electrostatic probe is examined with reference to the probe geometry. The study involves the evaluation of the probe lambda function, from which response-related characteristic parameters can be derived. These parameters enable the probe detection sensitivity Se and spatial selectivity Sp to be quantitatively assessed.",

author = "Torben Johansson and Crichton, {George C} and McAllister, {Iain Wilson}",

note = "Copyright 1999 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.; Conference on Electrical Insulation and Dielectric Phenomena 1999 ; Conference date: 17-10-1999 Through 20-10-1999",

year = "1999",

doi = "10.1109/CEIDP.1999.804610",

language = "English",

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booktitle = "1999 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, IEEE Publication 99CH36319",

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Johansson, T, Crichton, GC & McAllister, IW 1999, Influence of probe geometry on the response of an electrostatic probe. in 1999 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, IEEE Publication 99CH36319. IEEE, New York, pp. 137-141, Conference on Electrical Insulation and Dielectric Phenomena 1999, Austin, TX, United States, 17/10/1999. https://doi.org/10.1109/CEIDP.1999.804610

Influence of probe geometry on the response of an electrostatic probe. / Johansson, Torben; Crichton, George C; McAllister, Iain Wilson.
1999 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, IEEE Publication 99CH36319. New York: IEEE, 1999. p. 137-141.

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

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AU - Crichton, George C

AU - McAllister, Iain Wilson

N1 - Copyright 1999 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

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DO - 10.1109/CEIDP.1999.804610

M3 - Article in proceedings

SN - 0-7803-5414-1

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BT - 1999 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, IEEE Publication 99CH36319

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T2 - Conference on Electrical Insulation and Dielectric Phenomena 1999

Y2 - 17 October 1999 through 20 October 1999

ER -

Influence of probe geometry on the response of an electrostatic probe

Abstract

Conference

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