Influence of Polarization of the Incident Beam on Integrated Intensities in X-Ray Energy-Dispersive Diffractometry

J. Staun Olsen, B. Buras, T. Jensen, O. Alstrup, L. Gerward, B. Selsmark

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    Polarization measurements of the primary X-ray beam produced by thick copper and tungsten anodes are reported and formulas derived for integrated intensities of Bragg reflections in energy-dispersive diffractometry with the polarization of the primary beam taken into account. It was found that for an angle of 45° between the scattering plane and the plane containing the electron beam and the primary beam, the influence of polarization vanishes, while it increases as the angle changes from 45° to either 0 or 90°. For the latter values, the influence of polarization is considerable at high photon energies and at scattering angles close to 90
    Original languageEnglish
    JournalActa Crystallographica. Section A: Foundations of Crystallography
    Issue numberJAN
    Pages (from-to)84-87
    Publication statusPublished - 1978

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