Influence of geometrical alignment of the deformation microstructure on local migration of grain boundaries during recrystallization: A phase-field study

Vishal Yadav*, Nele Moelans, Yubin Zhang, Dorte Juul Jensen

*Corresponding author for this work

    Research output: Contribution to journalJournal articleResearchpeer-review

    27 Downloads (Pure)

    Abstract

    Effects of the geometrical alignment of an idealized deformation microstructure on the migration of recrystallization boundaries are studied using a phase-field model. A deformation field consisting of two sets of regularly arranged bands is used as an example to mimic typical deformed microstructures, while the migration of both initially flat and circular recrystallization boundaries are considered. The results show that for both cases the local variations in the deformation field affect not only the local shape of the migrating boundary but also the overall distances traveled. It is revealed that boundary migration into heterogeneously distributed energy fields are not uniform neither in space nor time, and can therefore not be expressed by the classic migration model with a uniform migration assumption, even when averaged over the whole boundary and long time.

    Original languageEnglish
    JournalScripta Materialia
    Volume191
    Pages (from-to)116-119
    ISSN1359-6462
    DOIs
    Publication statusPublished - 2021

    Keywords

    • Deformation
    • Grain boundary motion
    • Phase field model
    • Recrystallization

    Fingerprint

    Dive into the research topics of 'Influence of geometrical alignment of the deformation microstructure on local migration of grain boundaries during recrystallization: A phase-field study'. Together they form a unique fingerprint.

    Cite this