Influence of bulk dielectric polarization and void geometry upon PD transients

Iain Wilson McAllister, George C Crichton

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    Abstract

    The induced charge arising from a partial discharge consists of a component associated with the actual space charge in the void, and one related to changes in the polarization of the bulk dielectric. These changes are brought about by the field produced by the space charge. The influence of the void geometry upon the polarization component of the induced charge is examined for a heterogeneous bulk dielectric system. It is demonstrated that the relative magnitude of this component may either increase or decrease, depending on the ratio of the dielectric permittivities and within which dielectric the void is located. The magnitude of this effect is also dependent upon the prolateness/oblateness of the void geometry and on the orientation of the void.
    Original languageEnglish
    Title of host publication1999 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, IEEE Publication 99CH36319
    Place of PublicationNew York
    PublisherIEEE
    Publication date1999
    Pages197-201
    ISBN (Print)0-7803-5414-1
    DOIs
    Publication statusPublished - 1999
    EventConference on Electrical Insulation and Dielectric Phenomena 1999 - Austin, TX, United States
    Duration: 17 Oct 199920 Oct 1999
    http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6531

    Conference

    ConferenceConference on Electrical Insulation and Dielectric Phenomena 1999
    CountryUnited States
    CityAustin, TX
    Period17/10/199920/10/1999
    Internet address

    Bibliographical note

    Copyright 1999 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

    Cite this

    McAllister, I. W., & Crichton, G. C. (1999). Influence of bulk dielectric polarization and void geometry upon PD transients. In 1999 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, IEEE Publication 99CH36319 (pp. 197-201). IEEE. https://doi.org/10.1109/CEIDP.1999.804625