Influence of a carbon over-coat on the X-ray reflectance of XEUS mirrors

D.H. Lumb, Finn Erland Christensen, Carsten P. Cooper-Jensen, M. Krumrey

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

We describe measurements of the X-ray reflectance in the range 2-10 keV of samples representative of coated silicon wafers that are proposed for the fabrication of the X-ray evolving universe spectrometer (XEUS) mission. We compare the reflectance of silicon samples coated with bare Pt, with that for samples with an additional 10 nm thick carbon over-coating. We demonstrate a significant improvement in reflectance in the energy range similar to 1-4 keV, and at a grazing incidence angle of 10 mrad (0.57 degrees). We consider the resulting effective area that could be attained with an optimized design of the XEUS telescope. Typically an improvement of 10-60% in effective area, depending on photon energy, can be achieved using the carbon overcoat.
Original languageEnglish
JournalOptics Communications
Volume279
Issue number1
Pages (from-to)101-105
ISSN0030-4018
DOIs
Publication statusPublished - 2007

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