In situ spectroscopic characterization of a terahertz resonant cavity

Kimberly S. Reichel, Krzysztof Iwaszczuk, Peter Uhd Jepsen, Rajind Mendis, Daniel M. Mittleman

Research output: Contribution to journalLetterpeer-review

Abstract

In many cases, the characterization of the frequency- dependent electric field profile inside a narrowband res- onator is challenging, either due to limited optical access or to the perturbative effects of invasive probes. An isolated groove inside a terahertz parallel-plate wave- guide provides an opportunity to overcome these challenges, as it forms a narrowband resonator and also offers direct access to the resonant cavity via the open sides of the waveguide. We characterize the spatially varying spectral response of such a resonator using a noninvasive probe. We observe a frequency-dependent field enhancement, which varies depending on the location of the probe within the cavity. This spectral dependence cannot be observed using conventional far- field measurements
Original languageEnglish
JournalOptica
Volume1
Issue number5
Pages (from-to)272-275
ISSN2334-2536
DOIs
Publication statusPublished - 2014

Fingerprint Dive into the research topics of 'In situ spectroscopic characterization of a terahertz resonant cavity'. Together they form a unique fingerprint.

Cite this