In situ X-ray peak shape analysis of embedded individual grains during plastic deformation of metals

W. Pantleon; H.F. Poulsen; J. Almer; U. Lienert

doi:10.1016/j.msea.2004.02.080

In situ X-ray peak shape analysis of embedded individual grains during plastic deformation of metals

W. Pantleon, H.F. Poulsen, J. Almer, U. Lienert

Research output: Contribution to journal › Conference article › Research › peer-review

Original language	English
Journal	Materials Science and Engineering: A - Structural Materials: Properties, Microstructure and Processing
Volume	387-389
Pages (from-to)	339-342
ISSN	0921-5093
DOIs	https://doi.org/10.1016/j.msea.2004.02.080
Publication status	Published - 2004
Event	13th International Conference on the Strength of Materials - Budapest, Hungary Duration: 25 Aug 2003 → 30 Aug 2003 Conference number: 13

Conference

Conference	13th International Conference on the Strength of Materials
Number	13
Country/Territory	Hungary
City	Budapest
Period	25/08/2003 → 30/08/2003

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10.1016/j.msea.2004.02.080

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Cite this

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title = "In situ X-ray peak shape analysis of embedded individual grains during plastic deformation of metals",

keywords = "5-I nano",

author = "W. Pantleon and H.F. Poulsen and J. Almer and U. Lienert",

year = "2004",

doi = "10.1016/j.msea.2004.02.080",

language = "English",

volume = "387-389",

pages = "339--342",

journal = "Materials Science and Engineering: A - Structural Materials: Properties, Microstructure and Processing",

issn = "0921-5093",

publisher = "Elsevier",

note = "13th International Conference on the Strength of Materials, ICSMA-13 ; Conference date: 25-08-2003 Through 30-08-2003",

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In situ X-ray peak shape analysis of embedded individual grains during plastic deformation of metals. / Pantleon, W.; Poulsen, H.F.; Almer, J. et al.
In: Materials Science and Engineering: A - Structural Materials: Properties, Microstructure and Processing, Vol. 387-389, 2004, p. 339-342.

Research output: Contribution to journal › Conference article › Research › peer-review

TY - GEN

T1 - In situ X-ray peak shape analysis of embedded individual grains during plastic deformation of metals

AU - Pantleon, W.

AU - Poulsen, H.F.

AU - Almer, J.

AU - Lienert, U.

N1 - Conference code: 13

PY - 2004

Y1 - 2004

KW - 5-I nano

U2 - 10.1016/j.msea.2004.02.080

DO - 10.1016/j.msea.2004.02.080

M3 - Conference article

SN - 0921-5093

VL - 387-389

SP - 339

EP - 342

JO - Materials Science and Engineering: A - Structural Materials: Properties, Microstructure and Processing

JF - Materials Science and Engineering: A - Structural Materials: Properties, Microstructure and Processing

T2 - 13th International Conference on the Strength of Materials

Y2 - 25 August 2003 through 30 August 2003

ER -