Abstract
Self catalyzed GaAs nanowires grown on Si-treated GaAs substrates were studied with a transmission
electron microscope before and after annealing at 600◦C. At room temperature the nanowires have a zincblende
structure and are locally characterized by a high density of rotational twins and stacking faults. Selected area
diffraction patterns and high-resolution transmission electron microscopy images show that nanowires undergo
structural modifications upon annealing, suggesting a decrease of defect density following the thermal treatment.
Original language | English |
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Title of host publication | In situ transmission electron microscopy analyses of thermally annealed self catalyzed GaAs nanowires grown by molecular beam epitaxy |
Publication date | 2011 |
Publication status | Published - 2011 |
Event | 18th International Symposium "Nanostructures: Physics and Technology" - Ekaterinburg, Russian Federation Duration: 20 Jun 2011 → 25 Jun 2011 |
Conference
Conference | 18th International Symposium "Nanostructures: Physics and Technology" |
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Country/Territory | Russian Federation |
City | Ekaterinburg |
Period | 20/06/2011 → 25/06/2011 |