In-Situ Synchrotron X-ray Study of the Phase and Texture Evolution of Ceria and Superconductor Films Deposited by Chemical Solution Method

Zhao Yue; Jean-Claude Grivel; Dong He; P. G. Asanka Pramod Pallewatta; Asger Bech Abrahamsen; J. Bednarcik; M. v Zimmermann

doi:10.1016/j.phpro.2012.06.073

In-Situ Synchrotron X-ray Study of the Phase and Texture Evolution of Ceria and Superconductor Films Deposited by Chemical Solution Method

Zhao Yue, Jean-Claude Grivel, Dong He, P. G. Asanka Pramod Pallewatta, Asger Bech Abrahamsen, J. Bednarcik, M. v Zimmermann

Department of Energy Conversion and Storage

German Electron Synchrotron

Research output: Contribution to journal › Conference article › Research › peer-review

Abstract

In situ synchrotron x-ray diffraction is used to study the phase and texture formation of ceria based films and superconductor films deposited by the chemical solution method on technical substrates. Combined analysis using in situ synchrotron x-ray diffraction, thermogravimetry/differential thermal analysis and Fourier transform infra-red (FTIR) spectroscopy allows to study the details on the decomposition and crystallization processes of ceria based in form of bulk and film. The success of this work demonstrates the possibility of studying chemical reaction pathway and texture evolution of oxides starting from solution precursors using non destructive method.

Original language	English
Journal	Physics Procedia
Volume	36
Pages (from-to)	497-502
ISSN	1875-3892
DOIs	https://doi.org/10.1016/j.phpro.2012.06.073
Publication status	Published - 2012
Event	Superconductivity Centennial Conference (SCC-2011) - The Hague, Netherlands Duration: 18 Sept 2011 → 23 Sept 2011

Conference

Conference	Superconductivity Centennial Conference (SCC-2011)
Country/Territory	Netherlands
City	The Hague
Period	18/09/2011 → 23/09/2011

Keywords

Synchrotron radiation radiation
thin films
epitaxial growth
crystallization
Chemical solution deposition

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title = "In-Situ Synchrotron X-ray Study of the Phase and Texture Evolution of Ceria and Superconductor Films Deposited by Chemical Solution Method",

abstract = "In situ synchrotron x-ray diffraction is used to study the phase and texture formation of ceria based films and superconductor films deposited by the chemical solution method on technical substrates. Combined analysis using in situ synchrotron x-ray diffraction, thermogravimetry/differential thermal analysis and Fourier transform infra-red (FTIR) spectroscopy allows to study the details on the decomposition and crystallization processes of ceria based in form of bulk and film. The success of this work demonstrates the possibility of studying chemical reaction pathway and texture evolution of oxides starting from solution precursors using non destructive method.",

keywords = "Synchrotron radiation radiation, thin films, epitaxial growth, crystallization, Chemical solution deposition",

author = "Zhao Yue and Jean-Claude Grivel and Dong He and Pallewatta, {P. G. Asanka Pramod} and Abrahamsen, {Asger Bech} and J. Bednarcik and Zimmermann, {M. v}",

year = "2012",

doi = "10.1016/j.phpro.2012.06.073",

language = "English",

volume = "36",

pages = "497--502",

journal = "Physics Procedia",

issn = "1875-3892",

publisher = "Elsevier",

note = "Superconductivity Centennial Conference (SCC-2011) ; Conference date: 18-09-2011 Through 23-09-2011",

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AU - Yue, Zhao

AU - Grivel, Jean-Claude

AU - He, Dong

AU - Pallewatta, P. G. Asanka Pramod

AU - Abrahamsen, Asger Bech

AU - Bednarcik, J.

AU - Zimmermann, M. v

PY - 2012

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N2 - In situ synchrotron x-ray diffraction is used to study the phase and texture formation of ceria based films and superconductor films deposited by the chemical solution method on technical substrates. Combined analysis using in situ synchrotron x-ray diffraction, thermogravimetry/differential thermal analysis and Fourier transform infra-red (FTIR) spectroscopy allows to study the details on the decomposition and crystallization processes of ceria based in form of bulk and film. The success of this work demonstrates the possibility of studying chemical reaction pathway and texture evolution of oxides starting from solution precursors using non destructive method.

AB - In situ synchrotron x-ray diffraction is used to study the phase and texture formation of ceria based films and superconductor films deposited by the chemical solution method on technical substrates. Combined analysis using in situ synchrotron x-ray diffraction, thermogravimetry/differential thermal analysis and Fourier transform infra-red (FTIR) spectroscopy allows to study the details on the decomposition and crystallization processes of ceria based in form of bulk and film. The success of this work demonstrates the possibility of studying chemical reaction pathway and texture evolution of oxides starting from solution precursors using non destructive method.

KW - Synchrotron radiation radiation

KW - thin films

KW - epitaxial growth

KW - crystallization

KW - Chemical solution deposition

U2 - 10.1016/j.phpro.2012.06.073

DO - 10.1016/j.phpro.2012.06.073

M3 - Conference article

SN - 1875-3892

VL - 36

SP - 497

EP - 502

JO - Physics Procedia

JF - Physics Procedia

T2 - Superconductivity Centennial Conference (SCC-2011)

Y2 - 18 September 2011 through 23 September 2011

ER -

In-Situ Synchrotron X-ray Study of the Phase and Texture Evolution of Ceria and Superconductor Films Deposited by Chemical Solution Method

Abstract

Conference

Keywords

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