In-situ synchrotron x-ray study of the crystallization behavior of Ce0.9La0.1O2−x thin films deposited on NiW alloy substrates by chemical solution method

Zhao Yue, Jean-Claude Grivel, Asger Bech Abrahamsen, P. G. Asanka Pramod Pallewatta, Dong He, J. Bednarčík, M.v Zimmermann

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