In-situ synchrotron x-ray study of the crystallization behavior of Ce0.9La0.1O2−x thin films deposited on NiW alloy substrates by chemical solution method

Zhao Yue, Jean-Claude Grivel, Asger Bech Abrahamsen, P. G. Asanka Pramod Pallewatta, Dong He, J. Bednarčík, M.v Zimmermann

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    The phase and texture formation of La doped CeO2 (CLO) films deposited by the chemical solution method are studied by in situ synchrotron x-ray diffraction. It is found that the CLO crystallites forms excellent in-plane texture as soon as the phase appears at 860°C, indicating that interfacial nucleation dominates at the beginning of the amorphous–crystallization transition. Grain growth is almost complete after at 900°C for 15min. Analysis of the isothermal process of crystallization at 900°C by the Johnson–Mehl–Avrami–Kolmogorov equation shows that grain development is mainly controlled by diffusion. The success of this work demonstrates the possibility of studying crystallization behaviors of solution derived films using a non-destructive method, which has the potential of being applicable to most types of thin film samples.
    Original languageEnglish
    JournalMaterials Letters
    Volume65
    Issue number17-18
    Pages (from-to)2669-2672
    ISSN0167-577X
    DOIs
    Publication statusPublished - 2011

    Keywords

    • Materials characterisation and modelling

    Cite this

    @article{08b0fb864e1f496e8f3656a0a4b55a4c,
    title = "In-situ synchrotron x-ray study of the crystallization behavior of Ce0.9La0.1O2−x thin films deposited on NiW alloy substrates by chemical solution method",
    abstract = "The phase and texture formation of La doped CeO2 (CLO) films deposited by the chemical solution method are studied by in situ synchrotron x-ray diffraction. It is found that the CLO crystallites forms excellent in-plane texture as soon as the phase appears at 860°C, indicating that interfacial nucleation dominates at the beginning of the amorphous–crystallization transition. Grain growth is almost complete after at 900°C for 15min. Analysis of the isothermal process of crystallization at 900°C by the Johnson–Mehl–Avrami–Kolmogorov equation shows that grain development is mainly controlled by diffusion. The success of this work demonstrates the possibility of studying crystallization behaviors of solution derived films using a non-destructive method, which has the potential of being applicable to most types of thin film samples.",
    keywords = "Materials characterisation and modelling, Materialekarakterisering og modellering",
    author = "Zhao Yue and Jean-Claude Grivel and Abrahamsen, {Asger Bech} and Pallewatta, {P. G. Asanka Pramod} and Dong He and J. Bednarč{\'i}k and M.v Zimmermann",
    year = "2011",
    doi = "10.1016/j.matlet.2011.05.072",
    language = "English",
    volume = "65",
    pages = "2669--2672",
    journal = "Materials Letters",
    issn = "0167-577X",
    publisher = "Elsevier",
    number = "17-18",

    }

    In-situ synchrotron x-ray study of the crystallization behavior of Ce0.9La0.1O2−x thin films deposited on NiW alloy substrates by chemical solution method. / Yue, Zhao; Grivel, Jean-Claude; Abrahamsen, Asger Bech; Pallewatta, P. G. Asanka Pramod; He, Dong; Bednarčík, J.; Zimmermann, M.v.

    In: Materials Letters, Vol. 65, No. 17-18, 2011, p. 2669-2672.

    Research output: Contribution to journalJournal articleResearchpeer-review

    TY - JOUR

    T1 - In-situ synchrotron x-ray study of the crystallization behavior of Ce0.9La0.1O2−x thin films deposited on NiW alloy substrates by chemical solution method

    AU - Yue, Zhao

    AU - Grivel, Jean-Claude

    AU - Abrahamsen, Asger Bech

    AU - Pallewatta, P. G. Asanka Pramod

    AU - He, Dong

    AU - Bednarčík, J.

    AU - Zimmermann, M.v

    PY - 2011

    Y1 - 2011

    N2 - The phase and texture formation of La doped CeO2 (CLO) films deposited by the chemical solution method are studied by in situ synchrotron x-ray diffraction. It is found that the CLO crystallites forms excellent in-plane texture as soon as the phase appears at 860°C, indicating that interfacial nucleation dominates at the beginning of the amorphous–crystallization transition. Grain growth is almost complete after at 900°C for 15min. Analysis of the isothermal process of crystallization at 900°C by the Johnson–Mehl–Avrami–Kolmogorov equation shows that grain development is mainly controlled by diffusion. The success of this work demonstrates the possibility of studying crystallization behaviors of solution derived films using a non-destructive method, which has the potential of being applicable to most types of thin film samples.

    AB - The phase and texture formation of La doped CeO2 (CLO) films deposited by the chemical solution method are studied by in situ synchrotron x-ray diffraction. It is found that the CLO crystallites forms excellent in-plane texture as soon as the phase appears at 860°C, indicating that interfacial nucleation dominates at the beginning of the amorphous–crystallization transition. Grain growth is almost complete after at 900°C for 15min. Analysis of the isothermal process of crystallization at 900°C by the Johnson–Mehl–Avrami–Kolmogorov equation shows that grain development is mainly controlled by diffusion. The success of this work demonstrates the possibility of studying crystallization behaviors of solution derived films using a non-destructive method, which has the potential of being applicable to most types of thin film samples.

    KW - Materials characterisation and modelling

    KW - Materialekarakterisering og modellering

    U2 - 10.1016/j.matlet.2011.05.072

    DO - 10.1016/j.matlet.2011.05.072

    M3 - Journal article

    VL - 65

    SP - 2669

    EP - 2672

    JO - Materials Letters

    JF - Materials Letters

    SN - 0167-577X

    IS - 17-18

    ER -