In-situ synchrotron x-ray study of the crystallization behavior of Ce0.9La0.1O2−x thin films deposited on NiW alloy substrates by chemical solution method

Zhao Yue, Jean-Claude Grivel, Asger Bech Abrahamsen, P. G. Asanka Pramod Pallewatta, Dong He, J. Bednarčík, M.v Zimmermann

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    The phase and texture formation of La doped CeO2 (CLO) films deposited by the chemical solution method are studied by in situ synchrotron x-ray diffraction. It is found that the CLO crystallites forms excellent in-plane texture as soon as the phase appears at 860°C, indicating that interfacial nucleation dominates at the beginning of the amorphous–crystallization transition. Grain growth is almost complete after at 900°C for 15min. Analysis of the isothermal process of crystallization at 900°C by the Johnson–Mehl–Avrami–Kolmogorov equation shows that grain development is mainly controlled by diffusion. The success of this work demonstrates the possibility of studying crystallization behaviors of solution derived films using a non-destructive method, which has the potential of being applicable to most types of thin film samples.
    Original languageEnglish
    JournalMaterials Letters
    Volume65
    Issue number17-18
    Pages (from-to)2669-2672
    ISSN0167-577X
    DOIs
    Publication statusPublished - 2011

    Keywords

    • Materials characterisation and modelling

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