In Situ Ptychography of Heterogeneous Catalysts using Hard X-Rays: High Resolution Imaging at Ambient Pressure and Elevated Temperature

Sina Baier, Christian Danvad Damsgaard, Maria Scholz, Federico Benzi, Amélie Rochet, Robert Hoppe, Torsten Scherer, Junjie Shi, Arne Wittstock, Britta Weinhausen, Jakob Birkedal Wagner, Christian G. Schroer, Jan-Dierk Grunwaldt

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

A new closed cell is presented for in situ X-ray ptychography which allows studies under gas flow and at elevated temperature. In order to gain complementary information by transmission and scanning electron microscopy, the cell makes use of a Protochips E-chipTM which contains a small, thin electron transparent window and allows heating. Two gold-based systems, 50 nm gold particles and nanoporous gold as a relevant catalyst sample, were used for studying the feasibility of the cell. Measurements showing a resolution around 40 nm have been achieved under a flow of synthetic air and during heating up to temperatures of 933 K. An elevated temperature exhibited little influence on image quality and resolution. With this study, the potential of in situ hard X-ray ptychography for investigating annealing processes of real catalyst samples is demonstrated. Furthermore, the possibility to use the same sample holder for ex situ electron microscopy before and after the in situ study underlines the unique possibilities available with this combination of electron microscopy and X-ray microscopy on the same sample.
Original languageEnglish
JournalMicroscopy and Microanalysis
Volume22
Issue number1
Pages (from-to)178-88
Number of pages11
ISSN1431-9276
DOIs
Publication statusPublished - 2016

Keywords

  • X-ray microscopy
  • annealing
  • heterogeneous catalysis
  • in situ
  • nanoporous gold
  • ptychography
  • synchrotron radiation

Cite this

Baier, Sina ; Damsgaard, Christian Danvad ; Scholz, Maria ; Benzi, Federico ; Rochet, Amélie ; Hoppe, Robert ; Scherer, Torsten ; Shi, Junjie ; Wittstock, Arne ; Weinhausen, Britta ; Wagner, Jakob Birkedal ; Schroer, Christian G. ; Grunwaldt, Jan-Dierk. / In Situ Ptychography of Heterogeneous Catalysts using Hard X-Rays : High Resolution Imaging at Ambient Pressure and Elevated Temperature. In: Microscopy and Microanalysis. 2016 ; Vol. 22, No. 1. pp. 178-88.
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title = "In Situ Ptychography of Heterogeneous Catalysts using Hard X-Rays: High Resolution Imaging at Ambient Pressure and Elevated Temperature",
abstract = "A new closed cell is presented for in situ X-ray ptychography which allows studies under gas flow and at elevated temperature. In order to gain complementary information by transmission and scanning electron microscopy, the cell makes use of a Protochips E-chipTM which contains a small, thin electron transparent window and allows heating. Two gold-based systems, 50 nm gold particles and nanoporous gold as a relevant catalyst sample, were used for studying the feasibility of the cell. Measurements showing a resolution around 40 nm have been achieved under a flow of synthetic air and during heating up to temperatures of 933 K. An elevated temperature exhibited little influence on image quality and resolution. With this study, the potential of in situ hard X-ray ptychography for investigating annealing processes of real catalyst samples is demonstrated. Furthermore, the possibility to use the same sample holder for ex situ electron microscopy before and after the in situ study underlines the unique possibilities available with this combination of electron microscopy and X-ray microscopy on the same sample.",
keywords = "X-ray microscopy, annealing, heterogeneous catalysis, in situ, nanoporous gold, ptychography, synchrotron radiation",
author = "Sina Baier and Damsgaard, {Christian Danvad} and Maria Scholz and Federico Benzi and Am{\'e}lie Rochet and Robert Hoppe and Torsten Scherer and Junjie Shi and Arne Wittstock and Britta Weinhausen and Wagner, {Jakob Birkedal} and Schroer, {Christian G.} and Jan-Dierk Grunwaldt",
year = "2016",
doi = "10.1017/S1431927615015573",
language = "English",
volume = "22",
pages = "178--88",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
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Baier, S, Damsgaard, CD, Scholz, M, Benzi, F, Rochet, A, Hoppe, R, Scherer, T, Shi, J, Wittstock, A, Weinhausen, B, Wagner, JB, Schroer, CG & Grunwaldt, J-D 2016, 'In Situ Ptychography of Heterogeneous Catalysts using Hard X-Rays: High Resolution Imaging at Ambient Pressure and Elevated Temperature', Microscopy and Microanalysis, vol. 22, no. 1, pp. 178-88. https://doi.org/10.1017/S1431927615015573

In Situ Ptychography of Heterogeneous Catalysts using Hard X-Rays : High Resolution Imaging at Ambient Pressure and Elevated Temperature. / Baier, Sina; Damsgaard, Christian Danvad; Scholz, Maria; Benzi, Federico; Rochet, Amélie; Hoppe, Robert; Scherer, Torsten; Shi, Junjie; Wittstock, Arne; Weinhausen, Britta; Wagner, Jakob Birkedal; Schroer, Christian G.; Grunwaldt, Jan-Dierk.

In: Microscopy and Microanalysis, Vol. 22, No. 1, 2016, p. 178-88.

Research output: Contribution to journalJournal articleResearchpeer-review

TY - JOUR

T1 - In Situ Ptychography of Heterogeneous Catalysts using Hard X-Rays

T2 - High Resolution Imaging at Ambient Pressure and Elevated Temperature

AU - Baier, Sina

AU - Damsgaard, Christian Danvad

AU - Scholz, Maria

AU - Benzi, Federico

AU - Rochet, Amélie

AU - Hoppe, Robert

AU - Scherer, Torsten

AU - Shi, Junjie

AU - Wittstock, Arne

AU - Weinhausen, Britta

AU - Wagner, Jakob Birkedal

AU - Schroer, Christian G.

AU - Grunwaldt, Jan-Dierk

PY - 2016

Y1 - 2016

N2 - A new closed cell is presented for in situ X-ray ptychography which allows studies under gas flow and at elevated temperature. In order to gain complementary information by transmission and scanning electron microscopy, the cell makes use of a Protochips E-chipTM which contains a small, thin electron transparent window and allows heating. Two gold-based systems, 50 nm gold particles and nanoporous gold as a relevant catalyst sample, were used for studying the feasibility of the cell. Measurements showing a resolution around 40 nm have been achieved under a flow of synthetic air and during heating up to temperatures of 933 K. An elevated temperature exhibited little influence on image quality and resolution. With this study, the potential of in situ hard X-ray ptychography for investigating annealing processes of real catalyst samples is demonstrated. Furthermore, the possibility to use the same sample holder for ex situ electron microscopy before and after the in situ study underlines the unique possibilities available with this combination of electron microscopy and X-ray microscopy on the same sample.

AB - A new closed cell is presented for in situ X-ray ptychography which allows studies under gas flow and at elevated temperature. In order to gain complementary information by transmission and scanning electron microscopy, the cell makes use of a Protochips E-chipTM which contains a small, thin electron transparent window and allows heating. Two gold-based systems, 50 nm gold particles and nanoporous gold as a relevant catalyst sample, were used for studying the feasibility of the cell. Measurements showing a resolution around 40 nm have been achieved under a flow of synthetic air and during heating up to temperatures of 933 K. An elevated temperature exhibited little influence on image quality and resolution. With this study, the potential of in situ hard X-ray ptychography for investigating annealing processes of real catalyst samples is demonstrated. Furthermore, the possibility to use the same sample holder for ex situ electron microscopy before and after the in situ study underlines the unique possibilities available with this combination of electron microscopy and X-ray microscopy on the same sample.

KW - X-ray microscopy

KW - annealing

KW - heterogeneous catalysis

KW - in situ

KW - nanoporous gold

KW - ptychography

KW - synchrotron radiation

U2 - 10.1017/S1431927615015573

DO - 10.1017/S1431927615015573

M3 - Journal article

C2 - 26914998

VL - 22

SP - 178

EP - 188

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - 1

ER -