In-situ observation of highly strained aluminium microstructure dynamics during annealing by 3DXRD microscopy

J.R. Bowen, C. Gundlach, R.D. Doherty, H.F. Poulsen

Research output: Chapter in Book/Report/Conference proceeding › Conference abstract in proceedings › Research

Original language	English
Title of host publication	Final program
Number of pages	23
Place of Publication	Chicago
Publisher	TMS
Publication date	2003
Publication status	Published - 2003
Event	Materials Science and Technology 2003 - Chicago, IL, United States Duration: 9 Nov 2003 → 12 Nov 2003 http://www.tms.org/meetings/matscitech/2003/Home.shtml

Conference	Materials Science and Technology 2003
Country	United States
City	Chicago, IL
Period	09/11/2003 → 12/11/2003
Internet address	http://www.tms.org/meetings/matscitech/2003/Home.shtml

Access to Document

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title = "In-situ observation of highly strained aluminium microstructure dynamics during annealing by 3DXRD microscopy",

keywords = "5-I nano",

author = "J.R. Bowen and C. Gundlach and R.D. Doherty and H.F. Poulsen",

year = "2003",

language = "English",

booktitle = "Final program",

publisher = "TMS",

note = "Materials Science and Technology 2003 ; Conference date: 09-11-2003 Through 12-11-2003",

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TY - ABST

T1 - In-situ observation of highly strained aluminium microstructure dynamics during annealing by 3DXRD microscopy

AU - Bowen, J.R.

AU - Gundlach, C.

AU - Doherty, R.D.

AU - Poulsen, H.F.

PY - 2003

Y1 - 2003

KW - 5-I nano

M3 - Conference abstract in proceedings

BT - Final program

PB - TMS

CY - Chicago

T2 - Materials Science and Technology 2003

Y2 - 9 November 2003 through 12 November 2003

ER -