In-situ determination of grain boundary migration during recrystallization

D. Juul Jensen, E.M. Lauridsen, R.A. Vandermeer

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Original language	English
Title of host publication	Science and technology of interfaces
Editors	S. Ankem, C.S. Pande, I. Ovid'ko, S. Ranganathan
Place of Publication	Warrendale, PA
Publisher	TMS
Publication date	2002
Pages	361-374
ISBN (Print)	0-87339-520-4
Publication status	Published - 2002
Event	2002 TMS Annual Meeting and Exhibition - Seattle,WA, United States Duration: 17 Feb 2002 → 21 Feb 2002

Conference	2002 TMS Annual Meeting and Exhibition
Country/Territory	United States
City	Seattle,WA
Period	17/02/2002 → 21/02/2002

OpenUrl availability

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title = "In-situ determination of grain boundary migration during recrystallization",

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editor = "S. Ankem and C.S. Pande and I. Ovid'ko and S. Ranganathan",

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In-situ determination of grain boundary migration during recrystallization. / Juul Jensen, D.; Lauridsen, E.M.; Vandermeer, R.A.
Science and technology of interfaces. ed. / S. Ankem; C.S. Pande; I. Ovid'ko; S. Ranganathan. Warrendale, PA: TMS, 2002. p. 361-374.

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

TY - GEN

T1 - In-situ determination of grain boundary migration during recrystallization

AU - Juul Jensen, D.

AU - Lauridsen, E.M.

AU - Vandermeer, R.A.

PY - 2002

Y1 - 2002

KW - 5-I nano

M3 - Article in proceedings

SN - 0-87339-520-4

SP - 361

EP - 374

BT - Science and technology of interfaces

A2 - Ankem, S.

A2 - Pande, C.S.

A2 - Ovid'ko, I.

A2 - Ranganathan, S.

PB - TMS

CY - Warrendale, PA

T2 - 2002 TMS Annual Meeting and Exhibition

Y2 - 17 February 2002 through 21 February 2002

ER -