In-situ determination of grain boundary migration during recrystallization

D. Juul Jensen, E.M. Lauridsen, R.A. Vandermeer

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    Original languageEnglish
    Title of host publicationScience and technology of interfaces
    EditorsS. Ankem, C.S. Pande, I. Ovid'ko, S. Ranganathan
    Place of PublicationWarrendale, PA
    PublisherTMS
    Publication date2002
    Pages361-374
    ISBN (Print)0-87339-520-4
    Publication statusPublished - 2002
    Event2002 TMS Annual Meeting and Exhibition - Seattle,WA, United States
    Duration: 17 Feb 200221 Feb 2002

    Conference

    Conference2002 TMS Annual Meeting and Exhibition
    CountryUnited States
    CitySeattle,WA
    Period17/02/200221/02/2002

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