In-flight calibration system for the INTEGTAL X-ray Monitor JEM-X

E. Costa, Carl Budtz-Jørgensen, H.W. Schnopper

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Original language	English
Title of host publication	SPIE Proceedings
Number of pages	502
Volume	2806
Publication date	1996
Publication status	Published - 1996
Event	SPIE'S 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, United States Duration: 4 Aug 1996 → 9 Aug 1996

Conference	SPIE'S 1996 International Symposium on Optical Science, Engineering, and Instrumentation
Country/Territory	United States
City	Denver
Period	04/08/1996 → 09/08/1996

OpenUrl availability

@inproceedings{702ea186f90f4fd98f906f7eb0329648,

title = "In-flight calibration system for the INTEGTAL X-ray Monitor JEM-X",

author = "E. Costa and Carl Budtz-J{\o}rgensen and H.W. Schnopper",

year = "1996",

language = "English",

volume = "2806",

booktitle = "SPIE Proceedings",

note = "SPIE'S 1996 International Symposium on Optical Science, Engineering, and Instrumentation ; Conference date: 04-08-1996 Through 09-08-1996",

}